2021
DOI: 10.46300/9106.2021.15.62
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A 14-bit High Speed 125MS/s Low Power SAR ADC using Dual Split Capacitor DAC Architecture in 90nm CMOS Technology

Abstract: The proposed work presents a High speed 14-bit 125MS/s successive-approximation-register asynchronous analog-to-digital-converter (SAR-ADC). A novel-based Dual-Split-Array-Three-Section (DSATS) capacitor DAC (DSATS-CDAC) is employed to increase the linearity and energy efficiency of the digital-to-analog converter (DAC), additional advantage of this work is that, the area is reduced by 59.76% of conventional design. The proposed switching technique of the (DSATS-CDAC) consumes less switching energy. Additional… Show more

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Cited by 4 publications
(6 citation statements)
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“…Where the charge injection is defned as the charge that exists between the source and drain terminals when the sample switch is turned of, and the clock feed through is defned as the charge injected due to the overlapping coupling capacitor between the gate and drain terminals. Consequently, it is preferable to implement the sample switch by using CMOS transmission gates [8,64,103] or the bootstrap switch in Figure 4 [2,5,6,11,17,22,24,31,34,45,53,58,63,65 Te variations in conductivity are reduced by utilizing the CMOS transmission gates, but the problem of input dependence still exists. Additionally, a large parasitic capacitor that limits the resolution of SAR appears.…”
Section: Sar Sample and Hold Circuitmentioning
confidence: 99%
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“…Where the charge injection is defned as the charge that exists between the source and drain terminals when the sample switch is turned of, and the clock feed through is defned as the charge injected due to the overlapping coupling capacitor between the gate and drain terminals. Consequently, it is preferable to implement the sample switch by using CMOS transmission gates [8,64,103] or the bootstrap switch in Figure 4 [2,5,6,11,17,22,24,31,34,45,53,58,63,65 Te variations in conductivity are reduced by utilizing the CMOS transmission gates, but the problem of input dependence still exists. Additionally, a large parasitic capacitor that limits the resolution of SAR appears.…”
Section: Sar Sample and Hold Circuitmentioning
confidence: 99%
“…Comparator. Te preamplifer stage, single-stage dynamic latch, and bufer stage are integrated in the SAR comparator [1,31,103] to decrease the delay, power consumption, kick-back noise, and the inputreferred ofset voltage. Also, two inverter stages may be used with the single-stage dynamic latch [29,52,58] to avoid the static current at the reset phase and to enhance the driving capability and achieve rail-to-rail digital output.…”
Section: Tree-stage Dynamic Latchmentioning
confidence: 99%
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