2008 9th International Conference on Solid-State and Integrated-Circuit Technology 2008
DOI: 10.1109/icsict.2008.4734744
|View full text |Cite
|
Sign up to set email alerts
|

A 45nm low power bulk technology featuring carbon co-implantation and laser anneal on 45°-rotated substrate

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2009
2009
2009
2009

Publication Types

Select...
1
1

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…However, it requires an extra mask to selectively remove the SMT tensile layer on the PMOS region since the tensilestress liner degrades the hole mobility in PMOS. In low-power technology, the 45d rotated wafer ( 100 orientation on the (100) substrate) has been chosen considering both performance and cost for the following reasons: 1) Intrinsic hole mobility is higher compared to that of a normal wafer, and 2) hole mobility is insensitive to stress, hence the tensile-stress liner can be directly applied on the whole wafer to improve NMOS perfor- mance without degrading PMOS performance, thus reducing the cost [2], [3]. The blanket-SMT process is expected to be implemented on the 45d rotated wafer without degrading PMOS performance.…”
Section: Introductionmentioning
confidence: 99%
“…However, it requires an extra mask to selectively remove the SMT tensile layer on the PMOS region since the tensilestress liner degrades the hole mobility in PMOS. In low-power technology, the 45d rotated wafer ( 100 orientation on the (100) substrate) has been chosen considering both performance and cost for the following reasons: 1) Intrinsic hole mobility is higher compared to that of a normal wafer, and 2) hole mobility is insensitive to stress, hence the tensile-stress liner can be directly applied on the whole wafer to improve NMOS perfor- mance without degrading PMOS performance, thus reducing the cost [2], [3]. The blanket-SMT process is expected to be implemented on the 45d rotated wafer without degrading PMOS performance.…”
Section: Introductionmentioning
confidence: 99%