Extended Abstracts of the 1987 Conference on Solid State Devices and Materials 1987
DOI: 10.7567/ssdm.1987.a-1-3
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A 5.4μm2 Stacked Capacitor DRAM Cell with 0.6μm Quadruple-Polysilicon Gate Technology

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“…Fig. 7 compares the stored charge in the conventional quadruple-STC [3] and the present SISTC both using and not using the PEARL method. Stored charge is estimated assuming a 5-nm SiOz equivalent capacitor film and cell size of 4.2 pm2.…”
Section: Enlargement Of Storage Capacitancementioning
confidence: 97%
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“…Fig. 7 compares the stored charge in the conventional quadruple-STC [3] and the present SISTC both using and not using the PEARL method. Stored charge is estimated assuming a 5-nm SiOz equivalent capacitor film and cell size of 4.2 pm2.…”
Section: Enlargement Of Storage Capacitancementioning
confidence: 97%
“…However, the large alignment tolerance needed to prevent the plate and pad from shorting becomes a major obstacle to cell size reduction. On the other hand, in the quadruple-STC [3], since an Si02 interlayer exists between the storage capacitor and pad, it is not necessary to take the above-mentioned alignment tolerance into consideration when designing this memory cell. Therefore, the quadruple-STC can realize a smaller cell size than the triple-STC.…”
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confidence: 98%
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