A 68.7-fJ/b/mm 375-GB/s/mm Single-Ended PAM-4 Interface with Per-Pin Training Sequence for the Next-Generation HBM Controller

Park, Jung-Hun; Lee, Kwang-Hoon; Lee, Yong Jae; Sull, Jung-Woo; Song, Yong; Lee, Sang‐Hee; Lee, Hyeonseok; Cho, Hoyeon; Oh, Jonghyun; Ko, Han-Gon; Jeong, Deog‐Kyoon

doi:10.1109/vlsitechnologyandcir46769.2022.9830454

Cited by 6 publications

(1 citation statement)

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“…XMAS achieves the highest edge density compared to the studies over the past three years (see Fig. 19(b)) [19], [30]- [33]). Table I compares state-of-the-art interfaces over the past five years.…”

Section: Measurement Resultsmentioning

confidence: 90%

A 0.65-pJ/bit 3.6-TB/s/mm I/O Interface with XTalk Minimizing Affine Signaling for Next-Generation HBM with High Interconnect Density

Park,

Shin,

Kim

et al. 2024

Preprint

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This paper presents an I/O interface with Xtalk Minimizing Affine Signaling (XMAS), which is designed to support high-speed data transmission in die-to-die communication over silicon interposers or similar high-density interconnects susceptible to crosstalk. The operating principles of XMAS are elucidated through rigorous analyses, and its advantages over existing signaling are validated through numerical experiments. XMAS not only demonstrates exceptional crosstalk removing capabilities but also exhibits robustness against noise, especially simultaneous switching noise. Fabricated in a 28-nm CMOS process, the prototype XMAS transceiver achieves an edge density of 3.6 TB/s/mm and an energy efficiency of 0.65 pJ/b. Compared to the single-ended signaling, the crosstalk-induced peak-to-peak jitter of the received eye with XMAS is reduced by 75 % at 10 GS/s/pin data rate, and the horizontal eye opening extends to 0.2 UI at a bit error rate < 10 .

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Section: Measurement Resultsmentioning

confidence: 90%