This paper presents a BJT-based Temperature-to-Digital-Converter (TDC) that achieves ±0.25 • C 3σ-inaccuracy from −40 • C to +180 • C after a heater assisted voltage calibration. Its switched-capacitor (SC) ADC employs two samplingcapacitors, and thus the minimum number of critical sampling switches, which minimizes the effects of switch leakage at high temperatures and improves accuracy. The TDC is also equipped with an on-chip heater, with which the sensing BJTs can be rapidly (<0.5 s) heated to about 110 • C. This, in turn, enables voltage calibration at two different temperatures without the need for a temperature-controlled environment. Realized in a 0.16 µm standard CMOS, the TDC, including the on-chip heater, occupies 0.15 mm 2 and operates from 1.8 V .