2021
DOI: 10.1016/j.jssc.2020.121850
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A benzothiadiazole-containing π-conjugated small molecule as promising element for nonvolatile multilevel resistive memory device

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Cited by 16 publications
(23 citation statements)
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“…When the applied electric field overcomes the energy barrier, the traps created by the electron-withdrawing groups were filled, and the conductivity reaches the ON state. The ON state (LRS) slope (blue marked region) of the devices fitted to be around 1.0 indicates the ohmic conduction and denotes the formation of an efficient channel for charge transportation . These results explained that the trap-filled SCLC transport model controlled the switching characteristics of the devices.…”
Section: Resultsmentioning
confidence: 68%
See 1 more Smart Citation
“…When the applied electric field overcomes the energy barrier, the traps created by the electron-withdrawing groups were filled, and the conductivity reaches the ON state. The ON state (LRS) slope (blue marked region) of the devices fitted to be around 1.0 indicates the ohmic conduction and denotes the formation of an efficient channel for charge transportation . These results explained that the trap-filled SCLC transport model controlled the switching characteristics of the devices.…”
Section: Resultsmentioning
confidence: 68%
“…The ON state (LRS) slope (blue marked region) of the devices fitted to be around 1.0 indicates the ohmic conduction and denotes the formation of an efficient channel for charge transportation. 43 These results explained that the trap-filled SCLC transport model controlled the switching characteristics of the devices.…”
Section: ■ Introductionmentioning
confidence: 71%
“…This transition from ohmic to trap-filled charge transfer and then back to ohmic conductance proves that the trap-filled space-charge limited current (SCLC) mechanism prevails in these devices. 31 The devices with 14a–d tend to show similar mechanisms depicting the non-volatile WORM memory behavior of the devices.…”
Section: Resultsmentioning
confidence: 93%
“…In the low voltage area, the slope of the fitted curve is 1.07, and the current follows ohmic conduction (OC), which is mainly caused by the thermal excitation of the carriers in charge traps. [ 43 ] With the increase of the bias voltage, the traps are gradually filled, and the Fermi level gradually increases, approaching the conduction band. In this region, the slope of the fitted curve is 1.89, which follows the square law ( I ∝ V 2 ) and is called the trap‐filled limited current (TFLC).…”
Section: Resultsmentioning
confidence: 99%