2008 14th IEEE International on-Line Testing Symposium 2008
DOI: 10.1109/iolts.2008.21
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A BISR Architecture for Embedded Memories

Abstract: In this paper a BISR architecture for embedded memories is presented. The proposed scheme utilises a multiple bank cache-like memory for repairs. Statistical analysis is used for minimisation of the total resources required to achieve a very high fault coverage. Simulation results show that the proposed BISR scheme is characterised by high efficiency and low area overhead, even for high defect densities. On a 4Mbit memory and an average number of 1024 memory defects per IC, a repair ratio of 100% and over 90% … Show more

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Cited by 8 publications
(11 citation statements)
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“…Section IV concludes with the results for the benchmark 16Mbit (256Kx64) Memory Under Repair, demonstrating that the proposed memory BISR architecture is able to provide similar repairability results with the previous scheme of [18] on a reduced area overhead.…”
Section: Introductionmentioning
confidence: 81%
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“…Section IV concludes with the results for the benchmark 16Mbit (256Kx64) Memory Under Repair, demonstrating that the proposed memory BISR architecture is able to provide similar repairability results with the previous scheme of [18] on a reduced area overhead.…”
Section: Introductionmentioning
confidence: 81%
“…The difference between the scheme described in [18], onwards referred as non-segmented, and the present work's scheme, is that in case of a repair we choose to perform replacements at the bit level (d=1) instead of at the word level (d=M). Essentially, we downsize the data field from M bits to 1 bit and dedicate an m-bit offset pointer alongside the flag and tag fields, which identifies the specific bit that needs replacement.…”
Section: B Data Field Segmentationmentioning
confidence: 99%
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