A carrier removal method in phase measuring deflectometry based on the analytical carrier phase description

Yue, Huimin; Wu, Yue; Zhao, Biyu; Ou, Zhonghua; Liu, Yongzhi; Liu, Yong

doi:10.1364/oe.21.021756

Cited by 18 publications

(6 citation statements)

References 9 publications

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“…Owing to the uncertainty of the prior knowledge on the height, the slopes will be determined with errors and these errors will be propagated into the resultant height through the integration process. The height-slope ambiguity issue was partially solved by roughly assuming a prior height distribution [ 30 ], a height known seeding point [ 93 ], iterative reconstruction [ 69 ], using stereo vision [ 25 ], or the carrier removal method [ 94 ] to obtain the slope-related phase.…”

Section: Improved Phase-measuring Deflectometrymentioning

confidence: 99%

Three-Dimensional Shape Measurements of Specular Objects Using Phase-Measuring Deflectometry

Zhang

Wang

Huang

et al. 2017

Sensors

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The fast development in the fields of integrated circuits, photovoltaics, the automobile industry, advanced manufacturing, and astronomy have led to the importance and necessity of quickly and accurately obtaining three-dimensional (3D) shape data of specular surfaces for quality control and function evaluation. Owing to the advantages of a large dynamic range, non-contact operation, full-field and fast acquisition, high accuracy, and automatic data processing, phase-measuring deflectometry (PMD, also called fringe reflection profilometry) has been widely studied and applied in many fields. Phase information coded in the reflected fringe patterns relates to the local slope and height of the measured specular objects. The 3D shape is obtained by integrating the local gradient data or directly calculating the depth data from the phase information. We present a review of the relevant techniques regarding classical PMD. The improved PMD technique is then used to measure specular objects having discontinuous and/or isolated surfaces. Some influential factors on the measured results are presented. The challenges and future research directions are discussed to further advance PMD techniques. Finally, the application fields of PMD are briefly introduced.

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Section: Improved Phase-measuring Deflectometrymentioning

confidence: 99%

Three-Dimensional Shape Measurements of Specular Objects Using Phase-Measuring Deflectometry

Zhang

Wang

Huang

et al. 2017

Sensors

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“…The intensity of the captured fringe image can be expressed as I 0 ðx; yÞ ¼ aðx; yÞ þ X p j¼1 b j ðx; yÞ cosfj½ϕðx; yÞ þ 2πn∕Ng; (10) where 2πn∕N is the phase-shift amount and p is the highest harmonic order of the captured fringes. 26 (10), namely aðx; yÞ, b j ðx; yÞ (j ¼ 1∶p) and ϕðx; yÞ.…”

Section: Nonlinear Errormentioning

confidence: 99%

Phase error analysis and reduction in phase measuring deflectometry

Wu¹,

Yue²,

Yi³

et al. 2015

Opt. Eng

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In phase measuring deflectometry (PMD), the inspection accuracy of the defects and height of the specular surface are related to the level of phase errors. The usage of numeric integration in reconstructing the shape and the defocusing capture of the fringe pattern, which will amplify the phase errors, make error discussion more significant in PMD than other shape measurement techniques. Phase error analysis and reduction in PMD are presented. The random noises, nonlinear response function, the nontelecentric imaging of the charge-coupled device camera, and the nonlinear response function of the liquid crystal display screen are the main phase error sources in PMD. The analytical relation between the random phase error and its influence factors in PMD is deduced. From the relation formulation, the influence factors of random phase error are analyzed, and the results are proven by the simulation and experiment. A possible phase error-reduction method, which integrates several methods for congeneric errors in fringe projection profilometry, is investigated to reduce phase errors in PMD. This composite method is proven to have a good performance by a plane mirror experiment.

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“…They suggested that carrier component removal methods, already used in fringe projection profilometry (a technique for measuring diffusely reflecting surfaces), can be used to obtain the shape component of the distorted patterns. Yue et al [16] presented a carrier removal method based on a fitting of the captured pattern to the analytical equations described by Song.…”

Section: A Deflectometrymentioning

confidence: 99%

A simple deflectometric method for measurement of Quasi-Plane specular surfaces

Maestro-Watson

Izaguirre

Arana-Arexolaleiba

et al. 2015

2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM)

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Deflectometric methods have been extensively used, both in research and industry, to measure the shape of specular surfaces. The method presented in this paper makes it possible to evaluate the planarity of quasi-flat surfaces, i.e. to measure angular deviations between the average normal vector of the surface and the actual vector at each point of the surface (vector field errors). The method is based on homographies, a mathematical tool that has been widely tested in computer vision. Furthermore it is simple, computationally efficient and robust. Besides that, the proposed system does not require precise positioning of the measured part. The system requires only a single camera and an LCD screen, so it is a low cost solution.Simulations have been performed to validate the system, having obtained errors on the measured vector field that are in the order of less than 1 mrad, suitable for many applications. This is a work in progress and further experiments need to be carried out and several extensions could be considered.

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A carrier removal method in phase measuring deflectometry based on the analytical carrier phase description

Cited by 18 publications

References 9 publications

Three-Dimensional Shape Measurements of Specular Objects Using Phase-Measuring Deflectometry

Three-Dimensional Shape Measurements of Specular Objects Using Phase-Measuring Deflectometry

Phase error analysis and reduction in phase measuring deflectometry

A simple deflectometric method for measurement of Quasi-Plane specular surfaces

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