A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation

Chandra, Anshuman; Khan, Moiz; Patidar, Ankita; Takashima, Fumiaki; Goel, Sandeep Kumar; Shankaranarayanan, Bharath; Nguyen, Vuong; Tyagi, Vistrita; Arora, Manish

doi:10.1109/itc51656.2023.00011

2023 IEEE International Test Conference (ITC) 2023

DOI: 10.1109/itc51656.2023.00011

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A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation

Anshuman Chandra,

Moiz Khan,

Ankita Patidar

et al.

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Cited by 4 publications

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A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation

Cited by 4 publications

References 11 publications

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