A characteristic fluorescence correction factor for use in electron probe microanalysis. II. Evaluation of experimental results and comparisons

Schiebl, Christian; August, Hans-Jürgen; Wernisch, J.

doi:10.1051/mmm:0199100204042500

Microsc. Microanal. Microstruct.

1991

DOI: 10.1051/mmm:0199100204042500

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A characteristic fluorescence correction factor for use in electron probe microanalysis. II. Evaluation of experimental results and comparisons

Christian Schiebl¹,

Hans-Jürgen August²,

J. Wernisch

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1993

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Cited by 2 publications

References 29 publications

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The primary distribution of vacancies in the L‐shell after ionisation with electrons

Schiebl¹,

Wernisch

1993

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The extraction of the relative distribution of the primary generated vacancies, which have been produced by ionisation with electrons, that is, the vacancy distribution prior to the appearance of Coster Kronig transitions, is presented for the L‐subshells. Only fundamental parameters such as fluorescence yields, Coster Kronig transition probabilities, and relative intensities were used for the derivation. Furthermore, a closer look is taken at the energy dependence of these relative primary vacancy distributions.

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The primary distribution of vacancies in the L‐shell after ionisation with electrons

Schiebl¹,

Wernisch

1993

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Recent progress in electron probe microanalysis

Mackenzie

1993

Rep. Prog. Phys.

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Electron probe microanalysis (EPMA) is a fairly mature analytical technique which has been widely used in the fields of geochemistry and materials science since the early 1960s. The past decade or so has seen dramatic improvements, both theoretical and experimental, in the accuracy with which the concentrations of light elements such as oxygen can be measured by EPMA. This has coincided with a resurgence of interest in mixed-valence oxides which was stimulated by the discovery of high temperature superconductivity, and EPMA is now a vital tool for condensed matter physicists working in this field. Stoichiometric characterization is particularly important in the area of thin films, and a great deal of recent work has been devoted to modifying existing EPMA correction procedures in order to perform analyses of thin film or layered specimens. This article reviews the progress that has been made from a physicist's perspective, paying attention to the levels of accuracy and precision which are now attainable, and to the advantages and disadvantages of EPMA in relation to other analytical techniques.

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A characteristic fluorescence correction factor for use in electron probe microanalysis. II. Evaluation of experimental results and comparisons

Cited by 2 publications

References 29 publications

The primary distribution of vacancies in the L‐shell after ionisation with electrons

The primary distribution of vacancies in the L‐shell after ionisation with electrons

Recent progress in electron probe microanalysis

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