ACM SIGGRAPH 2010 Papers 2010
DOI: 10.1145/1833349.1778836
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A coaxial optical scanner for synchronous acquisition of 3D geometry and surface reflectance

Abstract: Shifted sinusoidal illumination patterns are useful for appearance capture because they simultaneously separate local and non-local reflections and allow the recovery of surface geometry. Here we show that the same illumination patterns can be used to estimate the local surface reflectance (BRDF) as well, provided that an appropriate correction factor is applied. We derive a closed-form expression for this correction factor, validate it experimentally, and discuss its implications. PreliminariesConsider the sy… Show more

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Cited by 62 publications
(50 citation statements)
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“…Setups to capture geometry, texture and optical material properties can range from very simple to very complex setups differing significantly regarding their performance. (Holroyd, Larence, & Zickler, 2010) move a co-axial setup of a camera and a light-source around an artefact during acquisition with an identical setup looking down on the artefact from above. (Schwartz & Klein, 2012) use a multiview/multilight setup of 151 consumer cameras and LED lights called the DOME to capture the shape as well as the appearance model of an artefact's surface.…”
Section: Cultarc3dmentioning
confidence: 99%
“…Setups to capture geometry, texture and optical material properties can range from very simple to very complex setups differing significantly regarding their performance. (Holroyd, Larence, & Zickler, 2010) move a co-axial setup of a camera and a light-source around an artefact during acquisition with an identical setup looking down on the artefact from above. (Schwartz & Klein, 2012) use a multiview/multilight setup of 151 consumer cameras and LED lights called the DOME to capture the shape as well as the appearance model of an artefact's surface.…”
Section: Cultarc3dmentioning
confidence: 99%
“…Several setups propose to have the light source or the detector at a fixed position and achieve the necessary angular configurations by changing the orientation of the material sample [2,19,20,41–44]. The setups proposed in [45,46] instead move both, sensor and light source, around the sample.…”
Section: Classification Of Device Designsmentioning
confidence: 99%
“…The authors of [21,59,60] employ additional auxiliary 3D scanners and register the geometry to the reflectance measurement. Several other devices [23,45,55,69–71,74] instead rely on an integrated structured light approach. This holds the advantage that the geometry is already registered with the reflectance measurements.…”
Section: Classification Of Device Designsmentioning
confidence: 99%
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