1979
DOI: 10.1016/0029-554x(79)90659-1
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A combination intermediate-image magnetic plus Si(Li) electron spectrometer for in-beam experiments

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Cited by 40 publications
(15 citation statements)
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“…B=background activity angular distributions, time spectra with respect to the beam pulses and four-parameter coincidence spectra. In the conversion-electron measurements we employed an intermediate-image magnetic plus Si(Li) electron spectrometer [23]. The resolution for 300-900 keV electrons was below 3.0 keV.…”
Section: Experimental Procedures and Resultsmentioning
confidence: 99%
“…B=background activity angular distributions, time spectra with respect to the beam pulses and four-parameter coincidence spectra. In the conversion-electron measurements we employed an intermediate-image magnetic plus Si(Li) electron spectrometer [23]. The resolution for 300-900 keV electrons was below 3.0 keV.…”
Section: Experimental Procedures and Resultsmentioning
confidence: 99%
“…In 7-ray spectroscopy we used 1-10 cm 3 planar and 7-25% coaxial Ge(Li) and hyperpure Ge detectors. In-beam conversion electron spectra were measured employing an intermediate-image magnetic beta spectrometer combined with a cooled Si(Li) detector [25] which gave a resolution of 2.5-3.0 keV for 200-700 keV electron lines.…”
Section: Methodsmentioning
confidence: 99%
“…In our electron spectrometer, the detected electrons leave the target at an average angle of 50 ~ and therefore the corrections for angular distribution effects are not necessary [25]. The electron spectra were normalized to the v-ray intensities with the aid of the 997keV 13/2+-,7/2 -E3 ground state transition.…”
Section: Conversion Electron Measurementsmentioning
confidence: 99%
“…The l~ material was enriched to 75 %. The conversion-electron data on l~ were obtained by a combination intermediate-image magnetic plus Si(Li) spectrometer [17]. Singles conversion-electron spectra ( Fig.…”
Section: Conversion-electron and 7-ray Measurementsmentioning
confidence: 99%