2020
DOI: 10.1109/ted.2019.2956193
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A Compact Phase Change Memory Model With Dynamic State Variables

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Cited by 14 publications
(12 citation statements)
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“…The structure-based PCM resistance model can be expressed as ( 6) [20]. In the equation, R C is the crystalline resistance outside the active area, and g f represents the dynamic conductance of the active area filament.…”
Section: Spice Modeling Methodsmentioning
confidence: 99%
See 3 more Smart Citations
“…The structure-based PCM resistance model can be expressed as ( 6) [20]. In the equation, R C is the crystalline resistance outside the active area, and g f represents the dynamic conductance of the active area filament.…”
Section: Spice Modeling Methodsmentioning
confidence: 99%
“…In the equation, R C is the crystalline resistance outside the active area, and g f represents the dynamic conductance of the active area filament. R A represents the static resistance of the active area and it can be calculated by conformal mapping, as shown in ( 7) [20].…”
Section: Spice Modeling Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…From a theoretical perspective, nanoscale modeling and simulations play important roles in PCM technology advancements. Empirical formulas and Johnson-Mehl-Avrami (JMA) models [8] are widely used in compact models [9][10][11]. At the numerical simulation level, a classical nucleation and growth (NG) model proposed by Peng et al [12] is commonly used to reflect the random nucleation and non-uniform distribution of phase states of materials.…”
Section: Introductionmentioning
confidence: 99%