A comparative STM and SPA-LEED study on the evolution of strain induced stripe pattern on Cu/Ni(100)

Nedelmann, Lorenz; Müller, Bert; Fischer, Björn; Kern, Klaus; Erdös, D.; Wollschläger, J.; Henzler, M.

doi:10.1016/s0039-6028(96)01309-x

Cited by 14 publications

(5 citation statements)

References 19 publications

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“…The protrusion, h Cu , is mostly sensitive to the intensity ratio between the transverse and longitudinal facet peaks. The obtained value of 0.5 Å compares favorably with the 0.4 Å obtained from the hard sphere model and high-resolution LEED (SPA-LEED) measurements [14] and the 0.6 Å originally observed by Müller et al [4]. The remaining parameters (b`, e rel , n c ) determine the intensity profiles of the longitudinal scans.…”

supporting

confidence: 84%

Unusual Strain Relaxation in Cu Thin Films on Ni(001)

et al. 1997

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Surface x-ray diffraction has been used to study the growth of thin Cu films on Ni(001). We give direct evidence for the formation of embedded wedges with internal ͕111͖ facets in the film, as recently suggested by Müller et al. [Phys. Rev. Lett. 76, 2358]. The unusual strain distribution within the wedges is determined and provides an explanation to the observed sudden change in growth and film morphology around 20 monolayers. [S0031-9007(97)

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supporting

confidence: 84%

Unusual Strain Relaxation in Cu Thin Films on Ni(001)

et al. 1997

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“…The formation of close-packed stacking faults is in fact an energetically efficient path to strain relief in other film orientations as well. Müller et al. , recently investigated the strain relief mechanisms for Cu layers on Ni(100). Similar to the (111) case, linear stripes of surface buckling were observed by STM.…”

Section: Structurementioning

confidence: 99%

Scanning Tunneling Microscopy Studies of Metal on Metal Epitaxy

Hwang

Bartelt

1997

Chem. Rev.

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“…The model used here for analysis of LEED intensities based on a simple sum of layer-bylayer contributions neglects effects such as intensity oscillations in LEED which can occur in particular for a (0,0) peak due to island growth on a surface. 25 It seems unlikely that an analogous situation would occur for a first-order (1,0) peak, however, nor for higher order peaks. Additionally, by selecting an energy for which the peak intensity is a maximum, these types of destructive interference effects are avoided.…”

Section: Discussionmentioning

confidence: 99%

Thickness monitoring of graphene on SiC using low-energy electron diffraction

Fisher

Luxmi

Srivastava

et al. 2010

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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The formation of epitaxial graphene on SiC is monitored in-situ using low-energy electron diffraction (LEED). The possibility of using LEED as an in-situ thickness monitor of the graphene is examined. The ratio of primary diffraction spot intensities for graphene compared to SiC is measured for a series of samples of known graphene thickness (determined using low-energy electron microscopy). It is found that this ratio is effective for determining graphene thicknesses in the range 1 to 3 monolayers. Effects of a distribution of graphene thicknesses on this method of thickness determination are considered.

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A comparative STM and SPA-LEED study on the evolution of strain induced stripe pattern on Cu/Ni(100)

Cited by 14 publications

References 19 publications

Unusual Strain Relaxation in Cu Thin Films on Ni(001)

Unusual Strain Relaxation in Cu Thin Films on Ni(001)

Scanning Tunneling Microscopy Studies of Metal on Metal Epitaxy

Thickness monitoring of graphene on SiC using low-energy electron diffraction

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