2016
DOI: 10.1016/j.vlsi.2015.12.002
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A comparative study on performance and reliability of 32-bit binary adders

Abstract: In this paper, the performance and reliability of different binary adder families are studied for both the superthreshold and the near-threshold regions of operation. The adder structures are selected from both the carry propagate adders (CPAs) and parallel prefix adders (PPAs). The performance parameters which are used in the comparative study include delay, power, energy, and energy-delay-product (EDP) of the adders. Additionally, the impacts of the process variation and negative bias temperature instability… Show more

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Cited by 10 publications
(5 citation statements)
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“…As shown in Figure 4, the SKA reduces the delay in calculating the intermediate prefixes. However, its fan-out will increase at each stage [9].…”
Section: Sklansky Addermentioning
confidence: 99%
“…As shown in Figure 4, the SKA reduces the delay in calculating the intermediate prefixes. However, its fan-out will increase at each stage [9].…”
Section: Sklansky Addermentioning
confidence: 99%
“…The parallel adders, based on CMOS have variation in delay, power consumption and PDP as, on average, 3%, where as in full swing GDI based, the variations are approximately about 1. Adder Efficiency: An approach of comparing different adders by defining Merit Factor (MF) based on the performance and the reliability parameters is discussed in [1]. The speed and energy consumption are the key parameters for determining the efficiency of the adders design, so the product of delay and power are considered as the merit factor.…”
Section: Csla_convmentioning
confidence: 99%
“…High power consumption raises temperature profile of the chip and affects overall performance of the system. Moreover, the explosive growth in laptops and portable personal communication systems demand long 1 Manuscript received 12 June 2016. Received in revised form 27 May 2017.…”
Section: Introductionmentioning
confidence: 99%
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“…5 During the process of attempting to improve transistor performance, the double-gated transistors showed good potential towards improving the switching strength and hence the performance of the transistor. [6][7][8][9][10][11] Despite this improvement, the new structure introduced different types of dimensional variability. Thus, process variation continued to be one of the main challenges for design reliability.…”
Section: Introductionmentioning
confidence: 99%