1979
DOI: 10.1109/tns.1979.4330345
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A Comparison of K-, L-, and M-X-Rays Produced by Proton and Electron Excitation

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“…Considering that the difference appears to depend on the detector thickness, and since electrons have a relatively large X-ray yield [13,14], we suggest that the escape of Si K X-rays and (possibly) of continuum radiation accounts for the observations. Note that Si K X-rays can effectively penetrate through several micrometres of silicon.…”
Section: Discussionmentioning
confidence: 78%
“…Considering that the difference appears to depend on the detector thickness, and since electrons have a relatively large X-ray yield [13,14], we suggest that the escape of Si K X-rays and (possibly) of continuum radiation accounts for the observations. Note that Si K X-rays can effectively penetrate through several micrometres of silicon.…”
Section: Discussionmentioning
confidence: 78%