2005
DOI: 10.1088/1742-6596/13/1/106
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A comparison of surface metrology techniques

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Cited by 59 publications
(34 citation statements)
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“…Furthermore, using this technique, the resolution is comparable with more expensive 3-D imaging techniques also used for fossils, as laser scanning (>50 µm), magnetic resonance imaging (>10 µm), neutron tomography (>30 µm). Also, using a distinct lens it can achieve micro-CT resolution (>1 µm) (Rahman and Smith, 2014;Sutton et al, 2014), considering that the current resolution limit for a white light image system is around 0.5 µm because diffraction effects limit the maximum possible resolution (Conroy and Armstrong, 2005).…”
Section: Discussionmentioning
confidence: 99%
“…Furthermore, using this technique, the resolution is comparable with more expensive 3-D imaging techniques also used for fossils, as laser scanning (>50 µm), magnetic resonance imaging (>10 µm), neutron tomography (>30 µm). Also, using a distinct lens it can achieve micro-CT resolution (>1 µm) (Rahman and Smith, 2014;Sutton et al, 2014), considering that the current resolution limit for a white light image system is around 0.5 µm because diffraction effects limit the maximum possible resolution (Conroy and Armstrong, 2005).…”
Section: Discussionmentioning
confidence: 99%
“…The optical detection system is shown in Figure 1a, including an LED light source, a lens system and a CCD (charge-coupled device) camera array with a long working distance objective lens. small-angle X-ray scattering metrology [26,27], atomic force microscopy [25,28], and stylus profiler [25,29]. It's a challenge for these methods to quickly detect such microstructures with the height of hundreds of microns during the fabrication processes.…”
Section: Methodsmentioning
confidence: 99%
“…For the detection of HARMS, the current methods include optical microscopy, white light interferometry [20,21], scanning electron microscopy (SEM) [22,23], optical scatterometry [24,25], small-angle X-ray scattering metrology [26,27], atomic force microscopy [25,28], and stylus 2 of 9 profiler [25,29]. It's a challenge for these methods to quickly detect such microstructures with the height of hundreds of microns during the fabrication processes.…”
Section: Introductionmentioning
confidence: 99%
“…The firm produces this line of instruments under the designation Talysurf CCI. One of these instruments is Talysurf CCI6000 (Conroy & Armstrong, 2005;Cincio et al, 2008;Lukianowicz, 2010). The principle of operation of this instrument, shown in Fig.…”
Section: Interference Microscope With Mirau Objective Lensesmentioning
confidence: 99%