2007
DOI: 10.1016/j.sse.2006.12.011
|View full text |Cite
|
Sign up to set email alerts
|

A comprehensive four parameters I–V model for GaAs MESFET output characteristics

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
11
0

Year Published

2009
2009
2022
2022

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 37 publications
(11 citation statements)
references
References 12 publications
0
11
0
Order By: Relevance
“…and carefully checked their accuracy. A typical comparison of the TriQuint TOM2 and Dobes (called Dobes in [17,18]) models [17][18][19][20]25] is shown in Fig. 3.…”
Section: Approximating the Scattering Parametersmentioning
confidence: 99%
See 1 more Smart Citation
“…and carefully checked their accuracy. A typical comparison of the TriQuint TOM2 and Dobes (called Dobes in [17,18]) models [17][18][19][20]25] is shown in Fig. 3.…”
Section: Approximating the Scattering Parametersmentioning
confidence: 99%
“…At present, there are many pHEMT models available in CAD tools. Their precision is often compared in references in a detailed way [17][18][19][20]. We have identified more types of the models used in low noise amplifiers, and we selected the one as a compromise between its accuracy and complexity.…”
Section: Introductionmentioning
confidence: 99%
“…In high-tech analog and digital circuits these devices are considered as attractive alternatives for high temperature, high power and high frequency applications due to their large bandgap, high breakdown voltage, large saturation velocity, high thermal conductivity and simplicity of fabrication [1][2][3]. However, with the reduction in channel length, control of short-channel effects (SCEs) is one of the biggest challenges in further downscaling of the technology [4,5]. The predominating SCEs are threshold voltage, drain induced barrier lowering (DIBL), subthreshold swing factor and higher leakage currents with decreasing channel length.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, applications of microwave and high-efficiency heterostructure field-effect transistors (HFETs) have been widely researched and reported [1][2][3][4][5][6]. Among of the HFETs, the metal-semi conductor field-effect transistors (MESFETs) use the gate depletion generated by metal-semiconductor contact to control the drain current [1,2].…”
Section: Introductionmentioning
confidence: 99%
“…Among of the HFETs, the metal-semi conductor field-effect transistors (MESFETs) use the gate depletion generated by metal-semiconductor contact to control the drain current [1,2]. However, the gate metal and the doped channel are contacted directly, which makes worse Schottky gate characteristics, limiting the gate forward voltage and the voltage swing.…”
Section: Introductionmentioning
confidence: 99%