1968
DOI: 10.1088/0022-3735/1/5/303
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A computer-linked cathode-ray tube microdensitometer for X-ray crystallography

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Cited by 76 publications
(30 citation statements)
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“…It is defined as: withlh = LL Ih.i h Arndt 4 introduced R svrn as a reliability indicator for data collected by precession photography, where R svrn was specifically summed over symmetry-related intensities on the same film, and R sca ' calculated in an analogous fashion, reported the agreement of identical reflections measured on different films. As oscillation photography was introduced, so that symmetry related reflections were not commonly on the same film, it appears that the original R svrn and R sca were combined into the present day R svlTI which is summed over all observed equivalent reflections.…”
mentioning
confidence: 99%
“…It is defined as: withlh = LL Ih.i h Arndt 4 introduced R svrn as a reliability indicator for data collected by precession photography, where R svrn was specifically summed over symmetry-related intensities on the same film, and R sca ' calculated in an analogous fashion, reported the agreement of identical reflections measured on different films. As oscillation photography was introduced, so that symmetry related reflections were not commonly on the same film, it appears that the original R svrn and R sca were combined into the present day R svlTI which is summed over all observed equivalent reflections.…”
mentioning
confidence: 99%
“…, where I i (hkl) is the observed intensity and <I(hkl)> is the average intensity of multiple observations from symmetry-related reflections [52].…”
Section: Overall Structure Of Dr1998mentioning
confidence: 99%
“…0.05-~m2 areas, containing ~650 unit cells, were microdensitometered (Arndt et al, 1968) at the equivalent of 4.4 if intervals, and the resulting 512 x 512 arrays were transformed on an IBM 370/165 computer. The digital transforms usually contained additional reflections not observed in the optical patterns.…”
Section: (C) Optical Diffractionmentioning
confidence: 99%