1973
DOI: 10.1080/00222739.1973.11689016
|View full text |Cite
|
Sign up to set email alerts
|

A Computer Program for Short-Circuited Waveguide Dielectric-Properties Measurements on High-or Low-Loss Materials*

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

1992
1992
2023
2023

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 12 publications
(2 citation statements)
references
References 6 publications
0
2
0
Order By: Relevance
“…At high frequency, a section of a transmission line such as a coaxial cable or a rectangular waveguide can be used. [1][2][3]6 For low loss dielectric properties measurements, cavity resonators are used in the full mode or perturbation mode. All these techniques require that a sample must be manufactured from its virgin state to a preferred geometry.…”
Section: Overview Of Current Techniquesmentioning
confidence: 99%
See 1 more Smart Citation
“…At high frequency, a section of a transmission line such as a coaxial cable or a rectangular waveguide can be used. [1][2][3]6 For low loss dielectric properties measurements, cavity resonators are used in the full mode or perturbation mode. All these techniques require that a sample must be manufactured from its virgin state to a preferred geometry.…”
Section: Overview Of Current Techniquesmentioning
confidence: 99%
“…The early research on dielectric properties measurements are very basic as illustrated by hand calculations performed by Von Hippel 1 or by the developed batch mode program described by Nelson et al 2,3 In both instances, to obtain the dielectric properties, the solutions of a complex transcendental equation must be found. Von Hippel 1,4 measured the voltage standing wave ratio (VSWR) as the microwave physical response from the sample.…”
Section: Introductionmentioning
confidence: 99%