Abstract:Yield analysis of microsystems is increasingly becoming important due to their decreasing feature sizes. Despite many ways and methods for statistical yield analysis, the contribution of worstcase methods in the yield analysis of microsystems is significant. Worst-case methods, in general, offer advantages like reduced number of simulations and a quantifiable yield metric in yield analysis of a system. However, the common yield analysis problems in MEMS and other microsystems have been identified to be falling… Show more
“…In [3], we describe how to perform a worst-case analysis in order to analyze and calculate parametric yield using enhanced worst-case methods. In [3], we proposed a critical enhancement to increase the accuracy of the worst-case methods. The accuracy was increased by considering nonlinear specification boundaries rather than linearized boundaries.…”
Section: Description Of the Best Practice Design Methodsmentioning
confidence: 99%
“…The worst-case distance calculated during the worst-case analysis as stated in [3], serves as the quantifiable metric for design robustness / yield. On observing the worst-case distances of various performance specifications, it can be known about a particular performance or a particular set of performances causing reduced parametric yield of the design.…”
Section: Yield Optimization Ofmems Using Worst-case Methodsmentioning
confidence: 99%
“…The model of the demonstrator has already been proven for its validity and conformation with fabrication data [13]. The WCAS function suite [3] has the capability to perform enhanced worst-case analysis as presented in [3]. Fig.4 exhibits a case where the WCAS function suite tracked the worst-case points from non-linear performance metamodels which include parameter interaction effects as well as the parameter quadratic effects.…”
Section: A Simple Demonstration Of the Best Practice Methodsmentioning
confidence: 99%
“…This phase of the design practice method is therefore termed as yield conformance using Monte Carlo analysis. This step in the methodology is only advisory and not compulsory as we employed enhanced worst-case analysis which proved to have a reasonably good conformance with Monte Carlo Analysis [3]. After the conformance test of the design yield using Monte Carlo analysis, the design is either diverted back to the yield optimization routine or sent forward to a FEM simulator based on the degree of accordance.…”
Section: Verification and Validation Ofthe Designmentioning
The intricacy in the manufacturing of MEMS devices has resulted in decreasing parametric yields. The problem of reduced parametric yield is increasing with the waning feature sizes. The necessity for yield enhancement in MEMS designs and particularly in commercial MEMS is being increasingly felt by the industry and therefore by the designers. There has been no standard methodology that could be followed to enhance yield in the design phase. In this paper we undertake effort in order to standardize a best practice design method in order to achieve a better yield in the design phase. The method is still in its infancy and has good scope for development. The validity of the proposed method is demonstrated via a simulation based approach on a U-Shaped micro electro thermal actuator.
“…In [3], we describe how to perform a worst-case analysis in order to analyze and calculate parametric yield using enhanced worst-case methods. In [3], we proposed a critical enhancement to increase the accuracy of the worst-case methods. The accuracy was increased by considering nonlinear specification boundaries rather than linearized boundaries.…”
Section: Description Of the Best Practice Design Methodsmentioning
confidence: 99%
“…The worst-case distance calculated during the worst-case analysis as stated in [3], serves as the quantifiable metric for design robustness / yield. On observing the worst-case distances of various performance specifications, it can be known about a particular performance or a particular set of performances causing reduced parametric yield of the design.…”
Section: Yield Optimization Ofmems Using Worst-case Methodsmentioning
confidence: 99%
“…The model of the demonstrator has already been proven for its validity and conformation with fabrication data [13]. The WCAS function suite [3] has the capability to perform enhanced worst-case analysis as presented in [3]. Fig.4 exhibits a case where the WCAS function suite tracked the worst-case points from non-linear performance metamodels which include parameter interaction effects as well as the parameter quadratic effects.…”
Section: A Simple Demonstration Of the Best Practice Methodsmentioning
confidence: 99%
“…This phase of the design practice method is therefore termed as yield conformance using Monte Carlo analysis. This step in the methodology is only advisory and not compulsory as we employed enhanced worst-case analysis which proved to have a reasonably good conformance with Monte Carlo Analysis [3]. After the conformance test of the design yield using Monte Carlo analysis, the design is either diverted back to the yield optimization routine or sent forward to a FEM simulator based on the degree of accordance.…”
Section: Verification and Validation Ofthe Designmentioning
The intricacy in the manufacturing of MEMS devices has resulted in decreasing parametric yields. The problem of reduced parametric yield is increasing with the waning feature sizes. The necessity for yield enhancement in MEMS designs and particularly in commercial MEMS is being increasingly felt by the industry and therefore by the designers. There has been no standard methodology that could be followed to enhance yield in the design phase. In this paper we undertake effort in order to standardize a best practice design method in order to achieve a better yield in the design phase. The method is still in its infancy and has good scope for development. The validity of the proposed method is demonstrated via a simulation based approach on a U-Shaped micro electro thermal actuator.
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