2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual 2007
DOI: 10.1109/relphy.2007.369927
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A Critical Enhancement in the Yield Analysis of Microsystems

Abstract: Yield analysis of microsystems is increasingly becoming important due to their decreasing feature sizes. Despite many ways and methods for statistical yield analysis, the contribution of worstcase methods in the yield analysis of microsystems is significant. Worst-case methods, in general, offer advantages like reduced number of simulations and a quantifiable yield metric in yield analysis of a system. However, the common yield analysis problems in MEMS and other microsystems have been identified to be falling… Show more

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Cited by 6 publications
(4 citation statements)
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“…In [3], we describe how to perform a worst-case analysis in order to analyze and calculate parametric yield using enhanced worst-case methods. In [3], we proposed a critical enhancement to increase the accuracy of the worst-case methods. The accuracy was increased by considering nonlinear specification boundaries rather than linearized boundaries.…”
Section: Description Of the Best Practice Design Methodsmentioning
confidence: 99%
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“…In [3], we describe how to perform a worst-case analysis in order to analyze and calculate parametric yield using enhanced worst-case methods. In [3], we proposed a critical enhancement to increase the accuracy of the worst-case methods. The accuracy was increased by considering nonlinear specification boundaries rather than linearized boundaries.…”
Section: Description Of the Best Practice Design Methodsmentioning
confidence: 99%
“…The worst-case distance calculated during the worst-case analysis as stated in [3], serves as the quantifiable metric for design robustness / yield. On observing the worst-case distances of various performance specifications, it can be known about a particular performance or a particular set of performances causing reduced parametric yield of the design.…”
Section: Yield Optimization Ofmems Using Worst-case Methodsmentioning
confidence: 99%
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