1985
DOI: 10.1016/0038-1101(85)90068-1
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A critical study of the effectiveness of the single and double exponential models for I–V characterization of solar cells

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Cited by 110 publications
(35 citation statements)
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“…The evaluation of these parameters has been the subject of investigation of several authors. Some of the methods use selected parts of the current-voltage (I-V) characteristic (Charles et al, 1981;1985) and those that exploit the whole characteristic (Easwarakhanthan et al, 1986;phang et al, 1986). (Santakrus et al, 2009) presents the use of properties of special trans function theory (STFT) for determining the ideality factor of real solar cell.…”
Section: Previous Workmentioning
confidence: 99%
“…The evaluation of these parameters has been the subject of investigation of several authors. Some of the methods use selected parts of the current-voltage (I-V) characteristic (Charles et al, 1981;1985) and those that exploit the whole characteristic (Easwarakhanthan et al, 1986;phang et al, 1986). (Santakrus et al, 2009) presents the use of properties of special trans function theory (STFT) for determining the ideality factor of real solar cell.…”
Section: Previous Workmentioning
confidence: 99%
“…Model parameters in Equation (1) can be obtained by different methods widely discussed in the literature. Many are numerical or mathematical [15][16][17][18][19][20][21] and others are based on local properties of the characteristic to find analytical expressions, 18,22 or to create a system of equations to be solved. [23][24][25] Nevertheless it is not the objective of this paper to discuss the modelling of the individual device in depth, but to present a model for the association supposing that cell parameters, or their statistical distribution, are known.…”
Section: Model Developmentmentioning
confidence: 99%
“…The equivalent electrical circuit for the junction is represented in Figure 2, two diodes D1 and D2 in parallel taking into account the diffusion and recombination mechanisms to which are added series (R) and shunt resistances (Rh). A specially conceived software [16], PARADI, extracts the From the point of view of the diode direct current measurement, any tiny subthreshold channel current would appear as a current flowing through the shunt resistance (Eq. 1).…”
Section: Introductionmentioning
confidence: 99%