2020 10th Institute of Electrical and Electronics Engineers International Conference on Cyber Technology in Automation, Control 2020
DOI: 10.1109/cyber50695.2020.9279161
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A defect detection method of gear end-face based on modified YOLO-V3

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Cited by 13 publications
(3 citation statements)
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“…Deep convolution and pointwise convolution were utilized to reduce the computational complexity of the model. Su et al [21] combined depthwise separable convolution with ResNet-34 as the feature extraction backbone network for YOLOv3, achieving the real-time detection of metal gear cross-sectional defects. The above-mentioned methods all redesign the backbone feature extraction network of YOLOv3 to achieve the precise detection of defect types.…”
Section: Related Workmentioning
confidence: 99%
“…Deep convolution and pointwise convolution were utilized to reduce the computational complexity of the model. Su et al [21] combined depthwise separable convolution with ResNet-34 as the feature extraction backbone network for YOLOv3, achieving the real-time detection of metal gear cross-sectional defects. The above-mentioned methods all redesign the backbone feature extraction network of YOLOv3 to achieve the precise detection of defect types.…”
Section: Related Workmentioning
confidence: 99%
“…Among these models, R-CNN, SSP-NET and Faster R-CNN have two detection stages, with high accuracy but much slower computing speed than YOLO and SSD models with primary structures. YOLO (You Look Only Once) includes YOLO, YOLOv3 [27][28][29][30][31], YOLOv4 [32] and YOLOv5 [33]. Other methods are favored by researchers because they could directly train the target position in single-stage operation.…”
Section: Introductionmentioning
confidence: 99%
“…(2) The regression-based target detection framework is dominated by the “you only look once” (yolo) series [ 18 , 19 , 20 , 21 ] and the single shot multibox detector (SSD) [ 22 ], which streamlines the feature extraction process to obtain a faster speed, but with accuracy slightly lacking in the same period of development. Combined with specific module design, this one-stage approach can often be efficiently applied to defect detection [ 23 ].…”
Section: Introductionmentioning
confidence: 99%