A delay metric for RC circuits based on the Weibull distribution

Liu, Frank; Kashyap, Chandramouli; Alpert, Charles J.

doi:10.1145/774572.774664

Cited by 39 publications

(44 citation statements)

References 13 publications

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“…The underlying circuit transfer function in these models have coincident poles with a real number order. In [18], the authors match the first two moments of the circuit to a Weibull distribution. Alternate second order models for the transfer function include those reported in [10] and [11], which involve generating equivalent circuits and are more suited for highly inductive lines.…”

Section: Analytic Modeling Of Interconnects For Deep Sub-micron Circuitsmentioning

confidence: 99%

Analytic modeling of interconnects for deep sub-micron circuits

Pamunuwa

Elassaad

Tenhunen

2003

ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)

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Closed form equations for second order transfer functions of general arbitrarily-coupled RC trees with multiple drivers are reported.The models allow precise delay and noise calculations for systems of coupled interconnects with guaranteed stability, and represent the minimum complexity associated with this class of circuits. The simplicity, accuracy and generality of the models make them suitable for use in early delay and noise planning of global signals in complex systems.

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Section: Analytic Modeling Of Interconnects For Deep Sub-micron Circuitsmentioning

confidence: 99%

Analytic modeling of interconnects for deep sub-micron circuits

Pamunuwa

Elassaad

Tenhunen

2003

ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)

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“…Alpert et al [3] proposed the D2M metric which is a simple function of the first two circuit moments. The PRIMO [4], h-Gamma [5], and WED [6] metrics are based on matching the moments of the impulse response to a particular continuous probability distribution function (PDF). PRIMO and h-Gamma match moments of the impulse response to the Gamma distribution, while WED matches to the Weibull distribution.…”

Section: Introductionmentioning

confidence: 99%

“…PRIMO and h-Gamma match moments of the impulse response to the Gamma distribution, while WED matches to the Weibull distribution. The approaches proposed in [4][5][6] require some type of table lookup operation. In order to improve the accuracy of the Elmore delay metric, Asymptotic Waveform Evaluation (AWE) is being proposed [10] by matching the higher order moments of the impulse response.…”

Section: Introductionmentioning

confidence: 99%

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Delay and Slew Metrics for On-Chip VLSI Interconnect

Kar¹,

Chattaraj²,

Chandra³

et al. 2010

IJCEE

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“…The Weibull distribution has been previously used to predict interconnect delay, [7]. The method used was moment matching for mean and standard deviation.…”

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confidence: 99%

Weibull based analytical waveform model

Amin¹,

Dartu²,

Ismail³

2003

ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)

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Current CMOS technologies are characterized by interconnect lines with increased relative resistance w.r.t. driver output resistance. Designs generate signal waveshapes that are very difficult to model using a single parameter model such as the transition time. In this paper, we present a simple and robust twoparameter analytical expression for waveform modeling based on the Weibull cumulative distribution function. The Weibull model accurately captures the variety of waveshapes without introducing significant runtime overhead and produces results with less than 5% error. We also present a fast and simple algorithm to convert waveforms obtained by circuit simulation to the Weibull model. A methodology for characterizing gates for the new model is also presented. Simulation results for many single and multiple input gates show errors well below 5%. Our model can be used in a mixed environment where some signals may still be characterized by a single parameter.

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A delay metric for RC circuits based on the Weibull distribution

Cited by 39 publications

References 13 publications

Analytic modeling of interconnects for deep sub-micron circuits

Analytic modeling of interconnects for deep sub-micron circuits

Delay and Slew Metrics for On-Chip VLSI Interconnect

Weibull based analytical waveform model

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