2018
DOI: 10.3390/ma11020305
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A Dislocation-Scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl Alloy

Abstract: In this work, plastic deformation was locally introduced at room temperature by nanoindentation on a γ-TiAl-based alloy. Comprehensive analyses of microstructures were performed before and after deformation. In particular, the Burgers vectors, the line directions, and the mechanical twinning systems were studied via accurate electron channeling contrast imaging. Accommodation of the deformation are reported and a scenario is proposed. All features help to explain the poor ductility of the TiAl-based alloys at … Show more

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Cited by 9 publications
(5 citation statements)
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“…Nanoindentation is an effective method to measure the mechanical properties of materials at the nanoscale, such as the elastic modulus, hardness and strain hardening effect. So far, this technology has been applied to obtain the mechanical properties of various materials including not only pure metals such as Al, Cu, Ag, Ni, and Fe [ 5 , 6 , 7 , 8 ]; but also alloys such as TiAl, U–Cu, Fe–Ni–C, Zr–Cu–Ag–Al and nickel superalloys [ 9 , 10 , 11 , 12 , 13 , 14 , 15 ].…”
Section: Introductionmentioning
confidence: 99%
“…Nanoindentation is an effective method to measure the mechanical properties of materials at the nanoscale, such as the elastic modulus, hardness and strain hardening effect. So far, this technology has been applied to obtain the mechanical properties of various materials including not only pure metals such as Al, Cu, Ag, Ni, and Fe [ 5 , 6 , 7 , 8 ]; but also alloys such as TiAl, U–Cu, Fe–Ni–C, Zr–Cu–Ag–Al and nickel superalloys [ 9 , 10 , 11 , 12 , 13 , 14 , 15 ].…”
Section: Introductionmentioning
confidence: 99%
“…Figure 1 a is an ECC micrograph of a twin-boundary already characterized by Electron BackScatter Diffraction (EBSD) [ 14 ]. It is carried out using a working distance of 7.3 mm, an acceleration voltage of 10 kV, and a pole piece mounted Backscattered Electron detector in a Zeiss Auriga electronic microscope (Zeiss SEM, Oberkochen, Germany).…”
Section: Methodsmentioning
confidence: 99%
“…Among these techniques, Electron Channeling Contrast Imaging (ECCI) is used in a Scanning Electron Microscope (SEM) for the observation and characterization of these defects in bulk materials [ 9 , 10 , 11 ]. ECCI is a non-destructive technique that provides Transmission Electron Microscope (TEM)-like diffraction contrast imaging of defects [ 10 , 12 , 13 , 14 ]. It is based on the electron channeling phenomenon, where electrons channel down the crystal planes for a given incidence angle between the incident beam and the crystallographic {hkl} planes.…”
Section: Introductionmentioning
confidence: 99%
“…Generally, mechanical testing is preceded and/or followed by microstructural investigations in order to get the structure-property-processing relationships [4,5,6,7]. In situ characterization provides more useful data for a more realistic theoretical modeling, which allows for predicting the mechanical performance of components.…”
Section: Introductionmentioning
confidence: 99%
“…In addition to EBSD analysis, direct SEM observations have been reported while using Electron Channeling Contrast Imaging (ECCI) to characterize for example, cracks in metals, such as NiAl single crystal [16] or also post mortem observation of subgrain-boundaries structures formed in ceramics during deformation [5,17,18].…”
Section: Introductionmentioning
confidence: 99%