2015
DOI: 10.1016/j.measurement.2014.10.013
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A disturbance-free surface profile measuring system with sinusoidal phase integrating-bucket modulation

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Cited by 6 publications
(1 citation statement)
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“…Therefore, laser interference projection is suitable for measuring the 3-D topography of small-sized objects and has a high application value and range. [7][8][9][10][11] The first component of the measurement system is a structured light projection device. In previous years, physical grating and mechanical equipment have been used as the main modes of achieving fringe pattern projection and phase shifting.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, laser interference projection is suitable for measuring the 3-D topography of small-sized objects and has a high application value and range. [7][8][9][10][11] The first component of the measurement system is a structured light projection device. In previous years, physical grating and mechanical equipment have been used as the main modes of achieving fringe pattern projection and phase shifting.…”
Section: Introductionmentioning
confidence: 99%