Abstract:Charge carrier lifetime is an important parameter for semiconductor materials. This study proposes a dynamic calibration method for injection‐dependent carrier lifetime measurements. This method is based on the comparison between lifetime measurements under quasi‐steady‐state and non‐quasi‐steady‐state conditions. The proposed method is first demonstrated by numerical simulation. Experimental data are subsequently used to compare the proposed method with conventional calibration methods, demonstrating good agr… Show more
“…In addition, the uorescence lifetime (Fig. S15 †) and carrier lifetime 49,50 (Fig. S16 †) of MIL-101(Cr) and SiW 6 Mo 6 @MIL-101(Cr) are nearly identical, indicating that SiW 6 Mo 6 also acts as an electronic repeater to stably store the transferred photoelectrons.…”
The one-step synthesis of urea at room temperature and pressure from N2 and CO2 has enormous economic and environmental benefits. In this study, the photocatalyst SiW6Mo6@MIL-101(Cr) was synthesized employing a...
“…In addition, the uorescence lifetime (Fig. S15 †) and carrier lifetime 49,50 (Fig. S16 †) of MIL-101(Cr) and SiW 6 Mo 6 @MIL-101(Cr) are nearly identical, indicating that SiW 6 Mo 6 also acts as an electronic repeater to stably store the transferred photoelectrons.…”
The one-step synthesis of urea at room temperature and pressure from N2 and CO2 has enormous economic and environmental benefits. In this study, the photocatalyst SiW6Mo6@MIL-101(Cr) was synthesized employing a...
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