2021
DOI: 10.1002/smtd.202100440
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A Dynamic Calibration Method for Injection‐Dependent Charge Carrier Lifetime Measurements

Abstract: Charge carrier lifetime is an important parameter for semiconductor materials. This study proposes a dynamic calibration method for injection‐dependent carrier lifetime measurements. This method is based on the comparison between lifetime measurements under quasi‐steady‐state and non‐quasi‐steady‐state conditions. The proposed method is first demonstrated by numerical simulation. Experimental data are subsequently used to compare the proposed method with conventional calibration methods, demonstrating good agr… Show more

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Cited by 2 publications
(1 citation statement)
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“…In addition, the uorescence lifetime (Fig. S15 †) and carrier lifetime 49,50 (Fig. S16 †) of MIL-101(Cr) and SiW 6 Mo 6 @MIL-101(Cr) are nearly identical, indicating that SiW 6 Mo 6 also acts as an electronic repeater to stably store the transferred photoelectrons.…”
Section: Photocatalytic Mechanismsmentioning
confidence: 97%
“…In addition, the uorescence lifetime (Fig. S15 †) and carrier lifetime 49,50 (Fig. S16 †) of MIL-101(Cr) and SiW 6 Mo 6 @MIL-101(Cr) are nearly identical, indicating that SiW 6 Mo 6 also acts as an electronic repeater to stably store the transferred photoelectrons.…”
Section: Photocatalytic Mechanismsmentioning
confidence: 97%