“…Any extension to embedded regions such as, substrate, passivation dielectric, etc., are included in the analysis by mean of an electromagnetic solver as demonstrated in [5,6]. The device Global Modeling of Multifinger MOSFETs with SB-SP combined analysis T 978-1-4244-3732-0/09/$25.00 ©2009 IEEE channel horizontal electron transport is modelled by the first three moments of the Boltzmann's Transport Equation in a simplified one dimensional form [8] and coupled with a self consistent Schrodinger-Poisson for the channel charge control model achieving a Quasi-2D simulator [5,6,7,9,10]: N ( x,t ) is the equilibrium carrier density in the channel as computed by the by the a priori self-consistent solution of Schrödinger's and Poisson's equations in the vertical direction for all gatechannel voltages; then, the results are fitted by a polynomial or by a rational function of the gate-channel voltage, and coupled to the transport equations. This arrangement accounts for the device layer structure and material composition, and allows extension of this model also to different types of FET's [5,6,7,9].…”