2015
DOI: 10.1145/2629688
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A Hardware Framework for Yield and Reliability Enhancement in Chip Multiprocessors

Abstract: Device reliability and manufacturability have emerged as dominant concerns in end-of-road CMOS devices. An increasing number of hardware failures are attributed to manufacturability or reliability problems. Maintaining an acceptable manufacturing yield for chips containing tens of billions of transistors with wide variations in device parameters has been identified as a great challenge. Additionally, today’s nanometer scale devices suffer from accelerated aging effects because of the extreme operating temperat… Show more

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