Industrial adoption of additive manufacturing (AM) processes demands improvement in the geometrical accuracy of manufactured parts. One key achievement would be to ensure that manufactured layer contours match the correspondent theoretical profiles, which would require integration of on-machine measurement devices capable of digitizing individual layers. Flatbed scanners should be considered as serious candidates, since they can achieve high scanning speeds at low prices. Nevertheless, image deformation phenomena reduce their suitability as two-dimensional verification devices. In this work, the possibilities of using flatbed scanners for AM contour verification are investigated. Image distortion errors are characterized and discussed and special attention is paid to the plication effect caused by contact imaging sensor (CIS) scanners. To compensate this phenomena, a new local distortion adjustment (LDA) method is proposed and its distortion correction capabilities are evaluated upon actual layer contours manufactured on a fused filament fabrication (FFF) machine. This proposed method is also compared to conventional global distortion adjustment (GDA). Results reveal quasi-systematic deformations of the images which could be minimized by means of distortion correction. Nevertheless, the irregular nature of such a distortion and the superposition of different errors penalize the use of GDA, to the point that it should not be used with CIS scanners. Conclusions indicate that LDA-based correction would enable the use of flatbed scanners in AM for on-machine verification tasks.Sensors 2020, 20, 1 2 of 24 following parts. Although this is the usual approach for quality assurance in AM it does not permit adoption of close-loop in-process improvements, and implies that optimization could not be done without previously manufacturing test specimens.Nevertheless, regarding the dimensional quality of manufactured parts, one key achievement would be to build layer contours that accurately follow theoretical profiles. This possibility would require on-machine integration of measurement devices to evaluate in-layer quality. The use of sensors capable of verifying each individual layer and checking the accuracy in contour tracing would allow for correction of the next layers. They would also make unnecessary previous testing of each particular geometry. Therefore, real-time, in-line metrology is commonly reported to be among the main challenges for AM development [9]. Contour verification could be carried out by means of different technologies, like structured light [7], conoscopic holography [10], coordinate measuring machine (CMM) optical probes [11] or ad hoc Charge-Couple Device (CCD) based instrumentation [12,13]. Nevertheless, computer vision based on flatbed scanner images should be considered as a serious candidate, since it can meet high scanning speeds at low prices.Flatbed scanners are optical devices commonly used to capture digital images of flat elements, such as sheets of paper or photographs. Nevertheless, image...