2012
DOI: 10.1117/12.922981
|View full text |Cite
|
Sign up to set email alerts
|

A hybrid approach to non-uniformity correction of large format emitter arrays

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2015
2015
2020
2020

Publication Types

Select...
1
1

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 8 publications
0
2
0
Order By: Relevance
“…The three basic steps of non-uniformity correction (NUC) may be performed using an iterative approach, with each successive round of data collection producing more uniform data. Further developments in iterative NUC [8] employ a hybrid strategy for correcting array non-uniformities. In this hybrid approach, data is collected using "flood" measurements at low radiance levels (often just a few degrees above the simulated temperature floor), and "sparse grid" measurements at higher radiance levels.…”
Section: Introductionmentioning
confidence: 99%
“…The three basic steps of non-uniformity correction (NUC) may be performed using an iterative approach, with each successive round of data collection producing more uniform data. Further developments in iterative NUC [8] employ a hybrid strategy for correcting array non-uniformities. In this hybrid approach, data is collected using "flood" measurements at low radiance levels (often just a few degrees above the simulated temperature floor), and "sparse grid" measurements at higher radiance levels.…”
Section: Introductionmentioning
confidence: 99%
“…Currently, the look-up table (LUT) method is used to reduce the nonuniformity at each pixel [8][9][10][11][12][13][14]; however, as the radiance range of the overall pixels must be standardized to alower value to achieve uniform radiation, the performance of this method is hindered for a wide radiance range of IRSPs. Therefore, to obtain high-quality IR images for wide radiance ranges, a nonuniformity reduction in emitters and ICs is required in addition to external correction.…”
Section: Introductionmentioning
confidence: 99%