A Kelvin transmission line pulsing system with optimized oscilloscope ranging

Gerdemann, Alex; Bhatia, Karan; Rosenbaum, Elyse

doi:10.1109/eosesd.2007.4401735

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Experimental Model Validation1

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Cited by 7 publications

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“…I-V measurements were obtained with a Kelvin transmission line pulse (TLP) system using 10 ns rise-time, 100 ns duration pulses [17].…”

Section: Experimental Model Validationmentioning

confidence: 99%

A scalable SCR compact model for ESD circuit simulation

Sarro

Rosenbaum

2008

2008 IEEE International Reliability Physics Symposium

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A scalable, compact model for SCR-based ESD-protection devices, which can simulate transient voltage overshoots observed on the timescale of charged device model (CDM) events, is presented. This model captures the effect that layout spacings have on SCR characteristics such as holding voltage and trigger current. Bias and time dependencies of SCR on-resistance are captured with a resistance model that accounts for self-heating and velocity saturation. [Keywords: Electrostatic discharge (ESD), silicon controller rectifier (SCR), compact modeling.]

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“…I-V measurements were obtained with a Kelvin transmission line pulse (TLP) system using 10 ns rise-time, 100 ns duration pulses [17].…”

Section: Experimental Model Validationmentioning

confidence: 99%