A Laser Source Integrating Sphere for the Measurement of Directional, Hemispherical Reflectance at High Temperatures

Kneissl, G. J.; Richmond, Joseph C.; Wiebelt, J. A.

doi:10.1016/b978-0-12-395737-5.50016-0

Cited by 11 publications

(6 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…The power fluctuation of gas lasers has been documented in other studies [12,15] and could be as much as ± 20% . The power fluctuation of gas lasers has been documented in other studies [12,15] and could be as much as ± 20% .…”

Section: Reflectance Measurementsmentioning

confidence: 78%

“…An integrating sphere is a spherical device which has its interior walls coated with a material that diffusely reflects a large fraction (--90%) of incident electromagnetic energy. Kneissl et al [12] presented measurements of spectral, directional-hemispherical reflectances for refractory materials at elevated temperatures, at three wavelengths, using an integrating sphere. The reflectance of the sample can be deduced from the ratio of signals from the sample and a reference of known reflectance.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Measurement of temperature and absorptance for laser processing applications

Ramanathan

Modest

1994

Journal of Laser Applications

View full text Add to dashboard Cite

Absorption measurements by laser calorimetryThe use of CO2 lasers has been successfully demonstrated for several manufacturing processes such as cutting, drilling, scribing, etc., of a wide range of materials. The absorptance of a material at the laser wavelength and at the material removal temperature substantially affect the efficiency of the laser machining process. Some materials have absorption bands in the mid-infrared and the absorptance changes drastically with temperature at the CO 2 laser wavelength of 10.6 pm. Additionally, the absorptance of a material can change due to high-temperature effects such as decomposition, oxidation, etc., necessitating the measurement of absorptance at temperatures close to the material removal temperature and, preferably, during the laser machining process. A relatively simple experimental set-up is presented for the measurement of material removal temperature and of the absorptance of ceramic materials at the CO 2 laser wavelength and at temperatures close to the material removal temperature. Experimental results have been obtained for hot-pressed silicon nitride and two continuous-fiber ceramic matrix composites, namely, carbon fibers embedded in a silicon carbide matrix (C/SiC) and silicon carbide fibers in a silicon carbide matrix (SiC/SiC). Temperatures were measured using an optical pyrometer while the absorptance measurements were performed with an integrating sphere. The material removal temperatures show good agreement with extrapolated equilibrium decomposition data; the absorptance data were found to be repeatable to within ±0.03.

show abstract

Section: Reflectance Measurementsmentioning

confidence: 78%

Section: Introductionmentioning

confidence: 99%

Measurement of temperature and absorptance for laser processing applications

Ramanathan

Modest

1994

Journal of Laser Applications

View full text Add to dashboard Cite

show abstract

“…Использование интегрирующих сфер в лазерной физике и оптоэлектронике началось с 1960-х гг., непосредственно после появления и начала внедрения в физическую практику лазеров [7][8][9][10]. Периодически активизируясь или затухая, это продолжается до настоящего времени [11,12].…”

Section: __________________________________________________________________________________ Morphologia • 2019 • том 13 • № 2 82unclassified

Multiple Projection Laser Microscopy in the Ulbricht Integrating Sphere (MPLM-UIS) using lens-less microscopes with CCD and CMOS (active-pixel) sensors, including angle sensitive ones.

Градов¹,

Orekhov²

2019

Morphologia

View full text Add to dashboard Cite

Шановні колеги! У рубриці "Методологія наукових досліджень" редакція продовжує публікацію матеріалів, що пов'язані з найважливішими аспектами наукової і навчальної діяльності: організаційно-методичним забезпеченням наукових видань, загальними принципами статистичного, біометричного і математичного супроводження досліджень, а також оригінальними методичними підходами вітчизняних і зарубіжних морфологів.

show abstract

“…Distribution data were also presented by Kneissl in Ref. 4 for sodium chloride (NaCl) surfaces at the three helium-neon (He-Ne) laser wavelengths of 0.63, 1.15, and 3.39 jum. For these wavelengths, the sodium chloride coating, as expected, was a good diffuser.…”

Section: Introductionmentioning

confidence: 99%

An investigation of infrared diffuser surfaces

Wood¹,

Smith²

1975

13th Aerospace Sciences Meeting

View full text Add to dashboard Cite

ARNOLD ENGINEERING DEVELOPMENT CENTER (XON) ARNOLD AIR FORCE STATION, TENNESSEE 37389 NOTICES When U. S. Government drawings specifications, or other data are used for any purpose other than a definitely related Government procurement operation, the Government thereby incurs no responsibility nor any obligation whatsoever, and the fact that the Government may have formulated, furnished, or in any way supplied the said drawings, specifications, or other data, is not to be regarded by implication or otherwise, or in any manner licensing the holder or any other person or corporation, or conveying any rights or permission to manufacture, use, or sell any patented invention that may in any way be related thereto. Qualified users may obtain copies of this report from the Defense Documentation Center. References to named commercial products in this report are not to be considered in any sense as an endorsement of the product by the United States Air Force or the Government. APPROVAL STATEMENT This technical report has been reviewed and is approved.

show abstract

A Laser Source Integrating Sphere for the Measurement of Directional, Hemispherical Reflectance at High Temperatures

Cited by 11 publications

References 9 publications

Measurement of temperature and absorptance for laser processing applications

Measurement of temperature and absorptance for laser processing applications

Multiple Projection Laser Microscopy in the Ulbricht Integrating Sphere (MPLM-UIS) using lens-less microscopes with CCD and CMOS (active-pixel) sensors, including angle sensitive ones.

An investigation of infrared diffuser surfaces

Contact Info

Product

Resources

About