A Low Cost Spectral Power Extraction Technique for RF Transceiver Testing

Hung, Tzu-Chieh; Huang, Jui Hsien

doi:10.1109/vts.2007.5

Cited by 2 publications

(2 citation statements)

References 12 publications

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“…The authors in Ref. 97) utilize the received-signal strength indicator (RSSI) that is already built-in for most RF transceivers as a spectrum power indicator for BIST applications. The output of an RSSI is a DC-like signal that can be used to display the received signal strength on the signal strength indication bar for cell phones.…”

Section: Dft and Bist Techniques For Rf Circuitsmentioning

confidence: 99%

Recent Advances in Analog, Mixed-Signal, and RF Testing

Cheng

Chang

2010

IPSJ Transactions on System LSI Design Methodology

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Due to the lack of widely applicable fault models, testing for analog, mixedsignal (AMS), and radio frequency (RF) circuits has been, and will continue to be, primarily based on checking their conformance to the specifications. However, with the higher level of integration and increased diversity of specifications for measurement, specification-based testing is becoming increasingly difficult and costly. As a result, design for testability (DfT), combined with automatic test stimuli generation, has gradually become a necessity to ensure test quality at an affordable cost. This paper provides an overview of cost-effective test techniques that either enhance circuit testability, or enable built-in self-test (BIST) for integrated AMS/RF frontends. In addition, we introduce several low-cost testing paradigms including the loopback testing, alternate testing, and digitally-assisted testing that offer the promise of significant test cost reduction with little or even no compromise in test quality. Moving forward, in addition to screening the defective parts, testing will play an increasingly important role in supporting other post-silicon quality assurance functions such as post-silicon validation, tuning, and in-field reliability of system chips.

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Section: Dft and Bist Techniques For Rf Circuitsmentioning

confidence: 99%

Recent Advances in Analog, Mixed-Signal, and RF Testing

Cheng

Chang

2010

IPSJ Transactions on System LSI Design Methodology

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“…These are not frequency-domain characteristics, but we shall see how such energy estimation methods may be useful in building a frequency-domain picture without the use of FFT. [5] presents a method wherein an RF transceiver may be configured to act as a spectrum analyzer to test itself and thereby obtain metrics such as input third-order intermodulation intercept point (IIP3).…”

mentioning

confidence: 99%

A Time-Domain Method for Pseudo-Spectral Characterization

Mishra

Soma

2008

26th IEEE VLSI Test Symposium (Vts 2008)

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We present a generic method for determining transfer function of a DUT using simple time-domain computations in place of conventional computationally intensive frequency domain methods. Our method uses a chirp stimulus and an average of absolute value to extract energy in different frequency bins. For an N0-size spectrum, this enables a reduction of computational complexity from N0 ln N0 multiply-accumulates (using an FFT) to N0 accumulates. This makes it an attractive strategy for BIST. We present the theoretical basis, test case simulations, and a comparison with the FFT method.

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A Low Cost Spectral Power Extraction Technique for RF Transceiver Testing

Cited by 2 publications

References 12 publications

Recent Advances in Analog, Mixed-Signal, and RF Testing

Recent Advances in Analog, Mixed-Signal, and RF Testing

A Time-Domain Method for Pseudo-Spectral Characterization

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