A low-power 256-Mb SDRAM with an on-chip thermometer and biased reference line sensing scheme

Yang, Wenxing; Tan, Han-Yuan

doi:10.1109/jssc.2002.807170

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Cited by 12 publications

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“…An on-chip temperature detector which is proportional to absolute temperature (PTAT) is used to detect the temperature in real time [9] . Figure 3 is a block diagram, where WSM is the write state machine.…”

Section: Circuit Designmentioning

confidence: 99%

Temperature self-adaptive program algorithm on 65 nm MLC NOR flash memory

Shi

Hong

Hu³

et al. 2009

J. Semicond.

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This paper presents an implementation for improving muti-level cell NOR flash memory program throughput based on the channel hot electron (CHE) temperature characteristic. The CHE Ig temperature characteristic is analyzed theoretically with the Lucky electron model, and a temperature self-adaptive programming algorithm is proposed to increase Ig according to the on-die temperature. Experimental results show that the program throughput increases significantly from 1.1 MByte/s without temperature self-adaptive programming to 1.4 MByte/s with the proposed method at room temperature. This represents a 30% improvement and is 70 times faster than the program throughput in Ref. [1].

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Section: Circuit Designmentioning

confidence: 99%