2020 IEEE International Electron Devices Meeting (IEDM) 2020
DOI: 10.1109/iedm13553.2020.9372107
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A Machine-Learning-Resistant 3D PUF with 8-layer Stacking Vertical RRAM and 0.014% Bit Error Rate Using In-Cell Stabilization Scheme for IoT Security Applications

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Cited by 11 publications
(15 citation statements)
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“…The device switching power consumption was approximately 2.4 aJ for the set process and 7.9 aJ for the reset process. It is comparable to the best ultralow-power devices reported in this field (Table 1; see text S2 for calculation) (34)(35)(36)(37). Because the DC operation can provide a stable and large dynamic range, the devices are operated using DC I-V operation for further computing demonstration.…”
Section: Characteristics Of the Srm Arraysupporting
confidence: 79%
See 1 more Smart Citation
“…The device switching power consumption was approximately 2.4 aJ for the set process and 7.9 aJ for the reset process. It is comparable to the best ultralow-power devices reported in this field (Table 1; see text S2 for calculation) (34)(35)(36)(37). Because the DC operation can provide a stable and large dynamic range, the devices are operated using DC I-V operation for further computing demonstration.…”
Section: Characteristics Of the Srm Arraysupporting
confidence: 79%
“…2C. Commonly, the SRMs exhibit forming-free characteristics (27)(28)(29)(30)(31)(32)(33)(34)(35) similar to the proposed SRM cell, as shown in Fig. 2D.…”
Section: Characteristics Of the Srm Arraymentioning
confidence: 53%
“…In addition, the computational parallelism is eventually restricted by the 2-D array structure. By leveraging the superior 3-D integration ability of the SRM devices [39][40][41][42] , we envisage a signi cant improvement in computational parallelism by mapping different rows of the compression matrix to different layers of a 3-D array. Furthermore, the computation can be completed in one step by simultaneously accessing different layers of the 3-D array.…”
Section: Solving Large-scale Sparse Matrix Equationmentioning
confidence: 99%
“…Nevertheless, because of their high intrinsic resistance, the current flowing through SRMs is typically low, which poses a considerable challenge to the peripheral sensing circuit. [65,101,105,132,[156][157] Additionally, as an undesirable issue for ideal MVM operation, the vast majority of SRMs have difficulty exhibiting the I-V linearity, which requires extra circuit compensation. [105] Current sensing is the primary readout scheme in IMC.…”
Section: Peripheral Circuitmentioning
confidence: 99%