1999
DOI: 10.1107/s0021889899000692
|View full text |Cite
|
Sign up to set email alerts
|

A maximum entropy method for determining column-length distributions from size-broadened X-ray diffraction profiles

Abstract: We present a novel application of the maximum entropy (MaxEnt) method for solving the double-inverse problems of removing instrument broadening from Xray diffraction pro®les and calculating the columnlength distribution of the crystallites. The MaxEnt approach is shown to have compelling advantages over the conventional methods it replaces: it is stable and robust, incorporates noise and a priori information into the solution, preserves positivity of the solution, and can be applied successively. We also show … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

2
7
0

Year Published

2001
2001
2022
2022

Publication Types

Select...
6
3

Relationship

1
8

Authors

Journals

citations
Cited by 21 publications
(9 citation statements)
references
References 21 publications
2
7
0
Order By: Relevance
“…Although the results from the Bayesian/MaxEnt method are in good agreement and address the limitations of the earlier work (see [ 30 , 10 ]), several important issues have been raised and are the subject of further investigation. These concern the accurate background estimation of the observed line profile and are very important; for example, the analysis of simulated data demonstrated how systematic errors affect the Fourier coefficients.…”
Section: Discussionsupporting
confidence: 66%
See 1 more Smart Citation
“…Although the results from the Bayesian/MaxEnt method are in good agreement and address the limitations of the earlier work (see [ 30 , 10 ]), several important issues have been raised and are the subject of further investigation. These concern the accurate background estimation of the observed line profile and are very important; for example, the analysis of simulated data demonstrated how systematic errors affect the Fourier coefficients.…”
Section: Discussionsupporting
confidence: 66%
“…This ensures that the statistics of the experimental data are transferred to quantifying the uncertainty in the solution. This approach also addresses a difficulty of the two-fold approach discussed by Armstrong & Kalceff (1999).…”
Section: Determining P (D) From G(s)mentioning
confidence: 99%
“…The full-width at half maximum (FWHM) for the (0002) ZnO peak is 0.18°, 0.19° and 0.18° for the ZnO films on Si, glass and PI substrates, respectively. The grain size of the ZnO films estimated by the Debye-Scherrer formula 39,41 is 48.2 nm, 45.7 nm and 51.2 nm for the ZnO films on Si, glass and PI, respectively, that are comparable to those well-performed ZnO films reported in other works 42,43 .…”
supporting
confidence: 83%
“…From pure physical line profile the Ê α -doublet peaks position and integral breadths of lines were determined. An average size of crystallites D was approximately calculated from the integral breadth of Ê α1 line using Sherrer equation [7,8]:…”
Section: Resultsmentioning
confidence: 99%