There has been significant work investigating the use of molecules as nanoscale rectifiers in so-called "molecular electronics". However, less attention has been paid to optimizing the design parameters of molecular rectifiers or to their inherent limitations. Here we use a barrier tunneling model to examine the degree of rectification that can be achieved and to provide insight for the design and development of molecules with optimum rectification responses.

Rates of water uptake by individual trees in a native Australian forest were measured on the Liverpool Plains, New South Wales, Australia, using sapflow sensors. These rates were up-scaled to stand transpiration rate (expressed per unit ground area) using sapwood area as the scalar, and these estimates were compared with modelled stand transpiration. A modified JarvisStewart modelling approach (Jarvis 1976), previously used to calculate canopy conductance, was used to calculate stand transpiration rate. Three environmental variables, namely solar radiation, vapour pressure deficit and soil moisture content, plus leaf area index, were used to calculate stand transpiration, using measured rates of tree water use to parameterise the model. Functional forms for the model were derived by use of a weighted non-linear least squares fitting procedure. The model was able to give comparable estimates of stand transpiration to those derived from a second set of sapflow measurements. It is suggested that short-term, intensive field campaigns where sapflow, weather and soil water content variables are measured could be used to estimate annual patterns of stand transpiration using daily variation in these three environmental variables. Such a methodology will find application in the forestry, mining and water resource management industries where long-term intensive data sets are frequently unavailable.

Diffraction profiles were analysed from thermally deposited 111-oriented gold films, ranging in thickness from 300 to 1900 Å. The data were collected using the high-resolution powder diffractometer on beamline BM16 at the European Synchrotron Research Facility (ESRF) set at a wavelength of 0.3507 Å. The profiles were measured under conventional symmetric θ–2θ reflection conditions and by asymmetric transmission diffraction to ensure that only crystallites oriented normal to the substrate contribute to the diffraction. An analysis of the instrument profile shape of the diffractometer was undertaken using the SRM 660 LaB6line profile standard. A parallel study of the films using atomic force microscopy and transmission electron microscopy was also undertaken to provide information on the dimensions of the crystallite columns in the films and the presence of dislocations. All the films displayed diffraction broadening arising from both crystallite-size effects and dislocation-induced strain effects. Analysis of the magnitude and anisotropy of the dislocation-induced broadening withhklindicates that the dislocations have a mixed screw/edge character and tend to form primarily on (111) slip planes parallel to the substrate at densities of ∼1015to 1016 m−2.

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