Proceedings of the 2004 IEEE International Frequency Control Symposium and Exposition, 2004.
DOI: 10.1109/freq.2004.1418425
|View full text |Cite
|
Sign up to set email alerts
|

A MEMS-based quartz resonator technology forGHhz applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
17
0
1

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 30 publications
(19 citation statements)
references
References 6 publications
1
17
0
1
Order By: Relevance
“…Many of these results have been reported previously [4]. Our newest results indicate that resonators with fundamental mode resonant frequencies approaching 3 GHz can be fabricated with these basic techniques.…”
Section: Resonator Resultssupporting
confidence: 63%
See 2 more Smart Citations
“…Many of these results have been reported previously [4]. Our newest results indicate that resonators with fundamental mode resonant frequencies approaching 3 GHz can be fabricated with these basic techniques.…”
Section: Resonator Resultssupporting
confidence: 63%
“…As reported previously, the temperature dependence of our first generation resonators was affected by bonding stresses at the Si substrate interface [4]. Using a 300°C Au-to-Au thermal compression bond, residual stress levels of several MPa were possible in the active areas of our designs.…”
Section: A Temperature Dependencementioning
confidence: 63%
See 1 more Smart Citation
“…The asymmetric thickness shear mode is common in quartz resonators, excited by the application of an AC signal across electrodes on opposing faces of a quartz crystal [13]. Unlike the quartz thickness shear mode, the electrode configuration of the dielectrically transduced silicon bar induces a symmetric mode, as shown in Figure 2 The lateral displacement u x for a one-dimensional thickness shear mode is given by…”
Section: Quarter-wave Thickness Shear Bar Resonatormentioning
confidence: 99%
“…Minimizing Equation 3.7 with respect to resonant frequency for a 200 nm dielectric film, one obtains an optimal frequency of operation at 15.8 GHz. Assuming an f Q product is 5×10 13 and a bias voltage of 20 V, this structure has 5 kΩ µm 2 impedance at 3rd harmonic resonance. For instance, a 50 Ω BST resonator at 15 GHz can be obtained by stacking the bulk/dielectric layers vertically (thickness extensional mode) with a 10 µm× 10 µm footprint, or by forming a 1 µm thick extensional ring [30] with an approximate radius of 16 µm.…”
Section: Analysis: Capacitive Drive and Sensementioning
confidence: 99%