A method for the characterization of sub-pixel response of near-infrared detectors

Biesiadzinski, T. P.; Tarlè, G.; Howe, Michael J. A.; Schubnell, M.; Lorenzon, W.; Weaverdyck, Curtis; Larson, Josh

doi:10.1117/12.857377

Cited by 3 publications

(3 citation statements)

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“…In addition, the charge diffusion model and capacitive coupling model are considered for infrared FPA photodetector with hybrid ROIC simultaneously. The magnitude of the charge diffusion and capacitive coupling are then determined by fitting this model to the raw beam spot scanning map data to calculate the IPS [21,22]. However, the beam profile must be known, which needs to be modeled by analytical calculation or tested by the knife-edge scans.…”

Section: Introductionmentioning

confidence: 99%

Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Zhong

Zhu

et al. 2021

Sensors

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The high-precision characterization of the intra-pixel sensitivity (IPS) for infrared focal plane array (FPA) photodetector is of great significance to high-precision photometry and astrometry in astronomy, as well as target tracking in under-sampled remote sensing images. The discrete sub-pixel response (DSPR) model and fill factor model have been used for IPS characterization in some studies. However, these models are incomplete and lack the description of physical process of charge diffusion and capacitance coupling, leading to the inaccuracy of IPS characterization. In this paper, we propose an improved IPS characterization method based on the diffusion and coupling physical (DCP) model for infrared FPA photodetector, which considering the processes of generation and collection of the charge, can improve the accuracy of IPS characterization. The IPS model can be obtained by convolving the ideal rectangular response function with the charge diffusion function and the capacitive coupling function. Then, the IPS model is convolved with the beam spot profile to obtain the beam spot scanning response model. Finally, we calculate the parameters of IPS by fitting the beam spot scanning response map with the proposed DCP model based on the Trust-Region-Reflective algorithm. Simulated results show that when using a 3 μm beam spot to scan, the error of IPS characterization based on DCP model is 0.63%, which is better than that of DSPR model’s 3.70%. Experimental results show that the fitting error of the beam spot scan response model based on DCP model is 4.29%, which is better than that of DSPR model’s 8.31%.

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Section: Introductionmentioning

confidence: 99%

Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Zhong

Zhu

et al. 2021

Sensors

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“…However, considering the spot scan, the time required to create a detector-wide map is prohibitive. To overcome this limitation, Biesiadzinski et al [4] designed a method based on a multi-spot projector, the spots-O-Matic.…”

Section: B Overview Of the Measurement Techniquesmentioning

confidence: 99%

“…It is the reason why the published results in literature are commonly limited to only a few pixels [3]. To overcome this limitation, Biesiadzinski et al [4] designed a method based on a multi-spot projector, the spots-O-Matic. The spots-O-Matic enables a two-dimensional scan of every pixel in a detector by projecting 160000 spots (on a 400x400 grid) onto the device.…”

Section: Introductionmentioning

confidence: 99%

Intrapixel measurement techniques on large focal plane arrays for astronomical applications: a comparative study

Ketchazo

Viale

Boulade

et al. 2017

International Conference on Space Optics — ICSO 2016

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A method for the characterization of intra-pixel response of infrared sensor

et al. 2019

Opt Quant Electron

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A method for the characterization of sub-pixel response of near-infrared detectors

Cited by 3 publications

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Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Intrapixel measurement techniques on large focal plane arrays for astronomical applications: a comparative study

A method for the characterization of intra-pixel response of infrared sensor

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