A Method for the Electromagnetic Characterization of Construction Materials Based on Fabry–Pérot Resonance

Degli-Esposti, Vittorio; Zoli, Marco; Vitucci, Enrico M.; Fuschini, Franco; Barbiroli, Marina; Chen, Jiajing

doi:10.1109/access.2017.2767278

Cited by 15 publications

(21 citation statements)

References 14 publications

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“…The conductivity appears to be increasing with frequency for almost all materials, in agreement with the frequency‐dependent formula suggested by ITU (International Telecommunication Union, 2015). Interestingly, marble represents an exception to the rule, confirming what was already found in Degli‐Esposti et al (2017).…”

Section: Application Resultssupporting

confidence: 88%

“…This phenomenon results in a frequency response pattern with a number of deep notches: the FP resonances (see, e.g., Figure 4a). By measuring the reflectivity of the slab for a given incidence angle over a wide‐enough bandwidth B in order to highlight at least two or three resonance notches, and estimating the frequency distance Δ f between two adjacent notches, it is possible to compute ε ′, according to the following equation (Degli‐Esposti et al, 2017):

ε' = {(\frac{c}{normalΔ f \cdot 2 w})}^{2} + {(\sin ϑ_{i})}^{2}

where w (m) is slab thickness, ϑ i (rad) is the incidence angle with respect to the surface normal, and c (m/s) is the speed of light. As the other quantities in Equation are derived from the setup, once Δ f is known, it is possible to estimate the value of ε ′, in the chosen bandwidth.…”

Section: Description Of the Methodsmentioning

confidence: 99%

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Improved Fabry‐Pérot Electromagnetic Material Characterization: Application and Results

et al. 2020

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While several mm-wave and sub-THz frequency bands are being proposed for next generation wireless systems to meet the increasing traffic demand, the electromagnetic properties of many common use materials at those frequencies still need to be determined. The evaluation of such properties is important for the design and deployment of future wireless networks. Recently, a simple method based on Fabry-Pérot resonance has been proposed to address the need of easy material characterization at mm-wave frequencies. In this study, the method has been improved and applied to the characterization of several materials at mm-wave and sub-THz frequencies, in order to assess its reliability, usability, and accuracy in practical cases. The method is shown to achieve a good accuracy level despite the very simple measurement setup and the great flexibility. However, some application limitations are highlighted and discussed in the paper. A method for electromagnetic material characterization based on an improved Fabry-Pérot technique is presented. Recently, a simple and fast method for the characterization of low-loss materials based on the Fabry-Pérot (FP) resonance that takes place inside a material slab has been proposed (Degli-Esposti et al., 2017).

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Section: Application Resultssupporting

confidence: 88%

ε' = {(\frac{c}{normalΔ f \cdot 2 w})}^{2} + {(\sin ϑ_{i})}^{2}

Section: Description Of the Methodsmentioning

confidence: 99%

Improved Fabry‐Pérot Electromagnetic Material Characterization: Application and Results

et al. 2020

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“…Moreover, EM properties of planar building materials have been characterized through VNA‐based measurements (Degli‐Esposti et al, ; Hajisaeid et al, ; Martin et al, ; Sagnard et al, , ). Nevertheless, accurate measurements of EM properties, e.g., the complex permittivity, of building materials are challenging in an open space environment (Ahmadi‐Shokouh et al, , ).…”

Section: Introductionmentioning

confidence: 99%

“…To characterize the two rays reflected by planar building materials, the two rays have to be resolved from measurement data. Moreover, EM properties of planar building materials have been characterized through VNA-based measurements (Degli-Esposti et al, 2017;Hajisaeid et al, 2018;Martin et al, 2017;Sagnard et al, 2005bSagnard et al, , 2005a. Nevertheless, accurate measurements of EM properties, e.g., the complex permittivity, of building materials are challenging in an open space environment (Ahmadi-Shokouh et al, 2009.…”

Section: Introductionmentioning

confidence: 99%

Two‐Ray Reflection Resolution Algorithm for Planar Material Electromagnetic Property Measurement at the Millimeter‐Wave Bands

et al. 2020

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Electromagnetic (EM) reflection properties of building materials and structures have been investigated through practical measurements. However, the finite thickness of measured materials makes it challenging to resolve the rays reflected from the front and the back surfaces. In this paper, we therefore present a three‐step minimum least squares‐based algorithm to resolve two closely adjacent rays reflected from the front and the back surfaces of a board‐shaped material. Our analytical and numerical results show that the proposed algorithm achieves the Cramér‐Rao lower bound. The proposed algorithm is validated using measurement data for various materials and incident angles in the 40–50 GHz frequency band. The validation results show that the proposed algorithm is capable of resolving two closely adjacent rays with a root‐mean‐square deviation that is smaller than 0.08. Main applications of the proposed algorithm can be found in the frequency domain measurements of the EM wave reflections by typical building structures, e.g., window glass, doors, ceiling, and floors.

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“…There are retrieval techniques available incorporating reflection coefficient data only. However, most of these techniques measure only complex permittivity while considering unity permeability as well as they require the prior knowledge of sample's thickness [28][29][30][31] In this paper, a novel free space frequency-timedomain technique has been proposed which employs only reflection coefficient data from the sample without the requirement of any complicated calibration procedure for determining the several dielectric properties (relative permittivity, relative permeability, thickness, attenuation constant, electrical conductivity, and losstangent) of the MUT. It does not require any prior knowledge of the thickness of the sample.…”

Section: Introductionmentioning

confidence: 99%

A free space frequency‐time‐domain technique for electromagnetic characterization of materials using reflection‐based measurement

Aman

Singh²,

Nilotpal³

et al. 2020

Int J RF Microw Comput Aided Eng

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In this report, a free space frequency-time-domain technique is presented for characterizing the electrical properties and thickness of the sample using multiple reflections and fabry-perot resonance phenomenon. The retrieval of constitutive electromagnetic parameters of the sample has been carried out by comparing the measured reflection coefficient data from the sample at two different incident angles. The relative permittivity as well as relative permeability along with the thickness of different samples viz., beryllia, silicon, and plexiglass have been evaluated with high accuracy in the frequency range 1 to 15 GHz. The method is also experimentally validated by successfully reconstructing the unknown material properties of two different samples. The unique advantage of this method lies in non-requirement of any prior knowledge of the sample's thickness for measuring the complex relative dielectric constant as well as relative permeability of the sample. To determine the electromagnetic properties of the sample, the sole knowledge of reflection coefficient data are needed. Moreover, the method does not involve any additional measurement for the reference calibration. The simple, cost-effective proposed scheme is quite useful in many applications like accurate determination of signal strength in indoor wireless communication, through wall imaging, food industry, and so on.

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A Method for the Electromagnetic Characterization of Construction Materials Based on Fabry–Pérot Resonance

Cited by 15 publications

References 14 publications

Improved Fabry‐Pérot Electromagnetic Material Characterization: Application and Results

Improved Fabry‐Pérot Electromagnetic Material Characterization: Application and Results

Two‐Ray Reflection Resolution Algorithm for Planar Material Electromagnetic Property Measurement at the Millimeter‐Wave Bands

A free space frequency‐time‐domain technique for electromagnetic characterization of materials using reflection‐based measurement

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