2000
DOI: 10.1007/978-3-540-44995-9_19
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A Method to Recover Design Patterns Using Software Product Metrics

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Cited by 19 publications
(8 citation statements)
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“…There is also a technique that outputs candidate patterns based on features derived from metric measurements [6]. However, it requires manual confirmation; this technique can roughly identify candidate patterns, but the final choice depends on the developer's skill.…”
Section: Conventional Techniques and Their Problemsmentioning
confidence: 99%
“…There is also a technique that outputs candidate patterns based on features derived from metric measurements [6]. However, it requires manual confirmation; this technique can roughly identify candidate patterns, but the final choice depends on the developer's skill.…”
Section: Conventional Techniques and Their Problemsmentioning
confidence: 99%
“…Another automatic approach based on metrics is proposed in Kim and Boldyreff (2000). The method is able to represent the source code in terms of metrics that can be of three possible categories: object-oriented, structural, and procedural.…”
Section: Related Workmentioning
confidence: 99%
“…Metric‐based techniques compute program‐related metrics (e.g., generalizations, aggregations, associations, and interface hierarchies) from different source code representations and compare their values with source code DP metrics. These techniques are computationally efficient because they reduce the search space through filtration . The limit is that they have been experimented on a few numbers of patterns.…”
Section: Related Workmentioning
confidence: 99%