A Model- Based Approach to Automatic Diagnosis Using General Purpose Circuit Simulators

Abstract

An approach is proposed to automatic testing of analog electronic circuits using PSpice-like general purpose circuit simulators based on parameterized models of the faulty elements. Using time domain response parameters that well characterize the faults, the set of typical faulty variants of the circuit is simulated. Using post-processing of the obtained results and macro-definitions in the graphical analyzer Probe, a diagnosis of parametric faults in the circuit is performed. The models of the faulty elements are defined in the form of parameterized library components for the Cadence PSpice simulator. Examples are given illustrating the proposed approach.

A nullor approach to computer-aided analogue circuit diagnosis

“…Many approaches have been developed to automate diagnosis of analogue and analogue-discrete circuits before and after test: model-based approaches [1,2], branch decomposition diagnosis at subcircuit and component levels [3,4], fault dictionary techniques, sensitivity-based, symbolic, spectral, neural network, optimization approaches [5][6][7], etc. The sensitivity analysis is applied in Slamani and Kaminska [7] for optimal test frequency selection in order to increase the fault observability and to avoid fault equivalence and fault masking.…”

A nullator-norator model-based approach to analog circuit diagnosis

“…Several approaches are proposed to automated diagnosis of analog and analog-discrete circuits: model-based approaches, branch decomposition diagnosis at subcircuit and component level, sensitivity-based, symbolic, optimization approaches, etc. [1][2][3][4][5][6][7]. Recently, a number of approaches are proposed to investigation of observability of the circuits by optimal test groups determination in order to increase the fault coverage.…”

“…Recently, a number of approaches are proposed to investigation of observability of the circuits by optimal test groups determination in order to increase the fault coverage. Model-based approaches are developed for diagnosis of parametric faults [1,3,4,7]. Two basic approaches are applied to the analog circuit diagnosis: using simulation before test (SBT) and using simulation after test (SAT).…”

“…A SAT diagnosis approach is developed in [7] using the program system CLP(R) with the possibility of solving linear set of equations and inequations for localization and identification parametric faults. A model-based approach is proposed in [3] to analog circuit diagnosis, based on parameterized models of the faulty elements. The approach is realized using the possibilities of general-purpose circuit simulators.…”