A Near-Field Probe for <i>In Situ</i> EMI Measurements of Industrial Installations

Quílez, Marcos; Aragon, Marc; Atienza, Andreu; Fernández-Chimeno, Mireya; Riu, Pere J.; Silva, F.

doi:10.1109/temc.2008.2004610

Cited by 7 publications

(4 citation statements)

References 6 publications

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“…The addition of the signal is directly related with H-Field and the subtraction is associated with E-Field. In previous developments [12][13][14], the addition and subtraction were carried out at the electronics attached to the Printed Circuit Board (PCB) probe. On the other hand, the probe shown in Fig.…”

Section: A Planar Double-loaded Loop Probementioning

confidence: 99%

Characterization of Time Domain EM Field Double-loaded Curved Loop Probe

Pous

Quílez

Fcmandez

et al. 2018

2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON)

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in this paper, we present and analyze the performance of a double-loaded curved loop probe to measure simultaneously electric and magnetic fields (EMF). The aim is to construct a probe that can be fitted to non-planar structures and have a proper response to EMF. The curved probe is studied in comparison with well-known planar probes, which have been verified and used previously. The time-domain data obtained through EM simulation allow us to identify if the probe's response is suitable although its geometry. Finally, the probe has been constructed and evaluated with experimental test, measuring and validating the conclusions find out by the EM simulation.

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Section: A Planar Double-loaded Loop Probementioning

confidence: 99%

Characterization of Time Domain EM Field Double-loaded Curved Loop Probe

Pous

Quílez

Fcmandez

et al. 2018

2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON)

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“…Subsequently, other works contributed to the development of some theoretical or practical aspects. Some of those designs reduced the size of the loop and incorporated electro-optical links to transmit the signals, making it possible to use double-loaded loops as nearfield probes [6], [7].…”

Section: Introductionmentioning

confidence: 99%

3D Printed Probe for Simultaneous E and H Fields Measurements

Quílez

Pous

Mateu-Mateus

et al. 2022

2022 International Symposium on Electromagnetic Compatibility – EMC Europe

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“…Dielectric properties reconstruction (Omrane et al, 2006) is another use of NF measurement. Measuring the coupling between components of microwave circuits (Baudry et al, 2007), calculating FF radiation pattern of large antennas (Yan et al, 1997), and testing for electromagnetic compatibility EMC (Baudry et al, 2007) and EMI (Quilez et al, 2008) are among the other uses of NF measurement.…”

Section: Introductionmentioning

confidence: 99%