2023
DOI: 10.1109/ted.2022.3225121
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A New 4H-SiC Trench MOSFET With Improved Reverse Conduction, Breakdown, and Switching Characteristics

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Cited by 13 publications
(5 citation statements)
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“…In this paper, Sentaurus TCAD tools are used to perform the device simulations and the compact model simulations. Standard SiC physical models are used in the simulation, including Fermi statistics, Shockley-Read-Hallre and Auger recombination, Okuto and GradQuasiFermi avalanche, incomplete dopant ionization, anisotropic material properties, and nonlocal tunneling [16,32]. The bandgap models are OldSlotboom and NoFermi.…”
Section: Device Structure and Mechanismmentioning
confidence: 99%
See 1 more Smart Citation
“…In this paper, Sentaurus TCAD tools are used to perform the device simulations and the compact model simulations. Standard SiC physical models are used in the simulation, including Fermi statistics, Shockley-Read-Hallre and Auger recombination, Okuto and GradQuasiFermi avalanche, incomplete dopant ionization, anisotropic material properties, and nonlocal tunneling [16,32]. The bandgap models are OldSlotboom and NoFermi.…”
Section: Device Structure and Mechanismmentioning
confidence: 99%
“…The fixed charge concentration along the SiC/SiO 2 interface is 1 × 10 11 cm −2 [33]. Other parameters of the material and models are adapted according to calibrated work in [16,32,34]. Besides, we also calibrated with the [4] as shown in figure 2.…”
Section: Device Structure and Mechanismmentioning
confidence: 99%
“…However, the complexity of the device fabrication process, which includes secondary epitaxial growth, poses challenges for its current commercialization. In 2023, J. Gao et al described a recessed source trench silicon carbide MOSFET with integrated MOS-channel diode (MCD) [27]. The MCD utilizes a short channel with adjustable length by varying the recessed depth.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4] A troublesome issue is that in an inverter system, it is essential to anti-parallel a fast freewheeling diode with the SiC MOSFET for loss reduction, because of the bipolar degradation problem 5,6) as well as the high turn-on voltage (∼2.7 V) of the body diode. [7][8][9] However, the resulting increase of extra capacitance and inductance is undesirable. Recently, integrating a diode with the MOSFET in a single chip is a popular and effective method to solve this issue.…”
Section: Introductionmentioning
confidence: 99%