A New Approach to Optical Crosstalk Modeling in Single-Photon Avalanche Diodes

Rech, Ivan; Ingargiola, Antonino; Spinelli, Roberto; Labanca, Ivan; Marangoni, Stefano; Ghioni, M.; Cova, S.

doi:10.1109/lpt.2007.915654

Cited by 37 publications

(32 citation statements)

References 15 publications

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“…Cross-talk is believed to be caused by photons produced in an avalanche, which knock off electrons in a neighbor pixel and trigger an additional avalanche [9]. It has been recently shown that the trajectories of the crosstalk inducing photons may not be straight lines but instead go through reflections within the substrate [10]. Either way, the photon propagation time is very short, hence the original and neighbor avalanches occur essentially at the same time.…”

Section: Pixelated Geiger-mode Avalanche Photon Detectorsmentioning

confidence: 99%

After-pulsing and cross-talk in multi-pixel photon counters

Retière

2008

Nuclear Instruments and Methods in Physics Research Section A:

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Section: Pixelated Geiger-mode Avalanche Photon Detectorsmentioning

confidence: 99%

After-pulsing and cross-talk in multi-pixel photon counters

Retière

2008

Nuclear Instruments and Methods in Physics Research Section A:

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“…The direct calibration of the crosstalk requires either the access to the outputs of individual pixels [25][26][27] which is not possible with commercially available MPPCs, or complicated optical setups which provide illumination of individual pixels [22].…”

Section: Methods Of Crosstalk Calibrationmentioning

confidence: 99%

Crosstalk calibration of multi-pixel photon counters using coherent states

Kalashnikov¹,

Tan²,

Krivitsky³

2012

Opt. Express

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Abstract:We present a novel method of calibration of crosstalk probability for multi-pixel photon counters (MPPCs) based on the measurement of the normalized second-order intensity correlation function of coherent light. The method was tested for several MPPCs, and was shown to be advantageous over the traditional calibration method based on the measurements of the dark noise statistics. The method can be applied without the need of modification for different kinds of spatially resolved single photon detectors.

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“…During the avalanche process, photons can be generated [12]. These photons can cause crosstalk in detector arrays.…”

Section: Temperature Dependence Of the Interarrival Time Inmentioning

confidence: 99%

Temperature Dependence of Dark Count Rate and After Pulsing of a Single-Photon Avalanche Diode with an Integrated Active Quenching Circuit in 0.35 μm CMOS

2018

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The temperature dependence of a single-photon avalanche diode (SPAD) with an integrated quencher in 0.35 μm CMOS is investigated. While the dark count rate strongly decreases with decreasing temperature, the after-pulsing probability (APP) does not change a lot in the investigated temperature range from −40°C to 50°C, although the dead time of the active quenching circuit (AQC) is only 9.5 ns. This and the measured histograms of the interarrival time (IAT) suggest that the traps involved have a very short lifetime, which is not strongly temperature dependent, or alternatively that the traps are not the main source of after pulses in the investigated device. Consequently, it may be necessary to find another explanation for the after pulses.

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A New Approach to Optical Crosstalk Modeling in Single-Photon Avalanche Diodes

Cited by 37 publications

References 15 publications

After-pulsing and cross-talk in multi-pixel photon counters

After-pulsing and cross-talk in multi-pixel photon counters

Crosstalk calibration of multi-pixel photon counters using coherent states

Temperature Dependence of Dark Count Rate and After Pulsing of a Single-Photon Avalanche Diode with an Integrated Active Quenching Circuit in 0.35 μm CMOS

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