2002
DOI: 10.1016/s0969-806x(01)00227-4
|View full text |Cite
|
Sign up to set email alerts
|

A new atomic database for X-ray spectroscopic calculations

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

8
246
1
6

Year Published

2006
2006
2024
2024

Publication Types

Select...
6
4

Relationship

0
10

Authors

Journals

citations
Cited by 289 publications
(261 citation statements)
references
References 14 publications
8
246
1
6
Order By: Relevance
“…This quantification procedure is based on a set of equations mathematically describing the fluorescence production and detection (Sherman 1955;Shiraiwa and Fujino 1966). The cross-sections for the interaction of X-rays with matter can be taken from databases (Elam et al 2002). The element concentrations can be determined in an iteration process.…”
Section: Results Of Different Analysesmentioning
confidence: 99%
“…This quantification procedure is based on a set of equations mathematically describing the fluorescence production and detection (Sherman 1955;Shiraiwa and Fujino 1966). The cross-sections for the interaction of X-rays with matter can be taken from databases (Elam et al 2002). The element concentrations can be determined in an iteration process.…”
Section: Results Of Different Analysesmentioning
confidence: 99%
“…Jump ratios and fluorescence yields were taken from the Elam database. [22] KLL and LMM in case of Ni, and LMM, MNN and NNN in case of Au, Auger electrons were considered, however, as a single line at the energy of the most intense Auger transition. Because the shelf is dominated by the electrons with high initial energy due to their longer range, it is not useful to put to much effort into the selection of the electron energies.…”
Section: Parameters For Numerical Calculationsmentioning
confidence: 99%
“…Values of ␦ and used in this work are obtained from the library described in Ref. 14, which is based on calculations made by Kissel et al 15 and by Elam et al 16 for fЈ and , respectively. If the object is thin along the radiation propagation direction, we can neglect deviation of the x-ray paths inside the object from straight lines ͑thin-sample approximation͒.…”
Section: Methodsmentioning
confidence: 99%