A new BICS for CMOS operational amplifiers by using oscillation test techniques

A BICS for CMOS opamps by monitoring the supply current peak

“…Now, the I copy is ten times smaller, then the NMOS replacing the resistor R S must be scaled again so that v i 's operating point to be the same as before: 2.1V. With these modifications, which suppose an improvement regarding area overhead, we detect the same faults reported in [3] and shown in Fig. 9.…”

“…We obtain the same fault coverage both with and without BICS [3]. We have injected an exhaustive list of faults derived from the circuit schematic to evaluate the merits of the test method proposed, as reported in [3]. A short and an open at the drain/source of each MOS transistor has been simulated, as well as at each component of the compensating network.…”

“…The presence of defects in the circuit impacts the oscillation frequency or even prevents it and can be used to distinguish between good and bad ICs. It has been also reported that the supply current can be an effective test observable with OTS to test CMOS opamps ( [2], [3]). In [2] we measured the supply current of an opamp using the oscillation-test strategy considering bridges and opens with different resistance values.…”

“…In [2] we measured the supply current of an opamp using the oscillation-test strategy considering bridges and opens with different resistance values. In [3] results showed that the most sensitive parameter was the supply current peak even when injecting GOS and floating gate defects. In [3], out of a number of 40 faults, 39 faults were detected using the negative supply current peak whose tolerance band was wide enough to expect a good robustness of the methodology.…”

“…In [3] results showed that the most sensitive parameter was the supply current peak even when injecting GOS and floating gate defects. In [3], out of a number of 40 faults, 39 faults were detected using the negative supply current peak whose tolerance band was wide enough to expect a good robustness of the methodology. Based on the high defect coverage of this technique we propose a BICS that monitors the current peak.…”