1999
DOI: 10.1109/16.777151
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A new look at impact ionization-Part II: Gain and noise in short avalanche photodiodes

Abstract: In Part I, a new theory for impact ionization that utilizes history-dependent ionization coefficients to account for the nonlocal nature of the ionization process has been described. In this paper, we will review this theory and extend it with the assumptions that are implicitly used in both the local-field theory in which the ionization coefficients are functions only of the local electric field and the new one. A systematic study of the noise characteristics of GaAs homojunction avalanche photodiodes with di… Show more

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Cited by 137 publications
(100 citation statements)
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“…The multiplication process is initiated by electrons and holes, and both are multiplied within the intrinsic region. According to the impact ionization theory [21][22][23][24] , a high excess noise factor should then be obtained as electrons and holes have quite similar impact ionization coefficients in Ge 25 . However, a narrow width multiplication region (500 nm) was chosen in the design to promote a large dead space effect 23,26 contribution favouring an efficient reduction of the excess noise factor.…”
Section: Resultsmentioning
confidence: 99%
“…The multiplication process is initiated by electrons and holes, and both are multiplied within the intrinsic region. According to the impact ionization theory [21][22][23][24] , a high excess noise factor should then be obtained as electrons and holes have quite similar impact ionization coefficients in Ge 25 . However, a narrow width multiplication region (500 nm) was chosen in the design to promote a large dead space effect 23,26 contribution favouring an efficient reduction of the excess noise factor.…”
Section: Resultsmentioning
confidence: 99%
“…The origin is at the interface of the n and i regions, and the thickness of the i region is ω. Thus, electrons are swept to the left and holes to the right [30].…”
Section: Theory Reviewmentioning
confidence: 99%
“…The ionization probability of this electron p e (x |x) in dx thus depends on the electron survival rate P se (x |x). The survival rate and ionization probability of holes are defined similarly [30].…”
Section: The History-dependent Theorymentioning
confidence: 99%
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