A new method to detect an X-ray diffracted beam at an angle of 90°

Hönnicke, Marcelo Gonçalves; Kakuno, Edson Massayuki; Cusatis, C.; Mazzaro, I.

doi:10.1107/s0021889804007423

Cited by 7 publications

(6 citation statements)

References 14 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Numerous methods to detect the back-diffracted h-beam profile have been proposed (Hashizume & Nakahata, 1988;Giles & Cusatis, 1991;Cusatis et al, 1996;Hö nnicke et al, 2004;Nikulin et al, 2001;Shvyd'ko et al, 2006). However, only a few of these are applicable to the detection of exact back-diffraction with good contrast (Cusatis et al, 1996;Hö nnicke et al, 2004;Shvyd'ko et al, 2006). Since there are some limitations in the detection of the back-diffracted h-beam profile, the most straightforward method to characterize XBD at lower energies is by detecting the forward-diffracted o beam, where exact XBD can be easily achieved.…”

Section: Introductionmentioning

confidence: 99%

Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer

et al. 2014

Self Cite

View full text Add to dashboard Cite

In this work, soft X‐ray back‐diffraction (XBD; X‐ray diffraction at angles near and exactly equal to 90°) is explored. The experiment was conducted at the SXS beamline at Laboratorio Nacional de Luz Sincrotron, Brazil, at ∼3.2 keV. A high‐resolution Si(220) multi‐bounce back‐diffraction monochromator was designed and constructed for this experiment. An ultra‐thin Si(220) crystal (5 µm thick) was used as the sample. This ultra‐thin crystal was characterized by profilometry, rocking‐curve measurements and X‐ray topography prior to the XBD measurements. It is shown that the measured forward‐diffracted beam (o‐beam) profiles, taken at different temperatures, are in close agreement with profiles predicted by the extended dynamical theory of X‐ray diffraction, with the absence of multiple‐beam diffraction (MBD). This is an important result for future studies on the basic properties of back‐diffracted X‐ray beams at energies slightly above the exact XBD condition (extreme condition where XBD is almost extinguished). Also, the results presented here indicate that stressed crystals behave like ideal strain‐free crystals when used for low‐energy XBD. This is mainly due to the large widths of XBD profiles, which lead to a low strain sensitivity in the detection of defects. This result opens up new possibilities for mounting spherical analyzers without degrading the energy resolution, at least for low energies. This is a path that may be used to construct a soft inelastic X‐ray scattering spectrometer where different applications such as element‐specific magnetic imaging tools could be explored.

show abstract

Section: Introductionmentioning

confidence: 99%

Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer

et al. 2014

Self Cite

View full text Add to dashboard Cite

show abstract

“…This was shown by Zheludeva et al (1985) for a photodiode point detector and by Holý et al (1985), who measured the photoconductivity of the second crystal in a double-crystal monochromator as a function of the angle. The strong * Correspondence e-mail: christian.gollwitzer@ptb.de angular and energy dependency of the detected signal as a result of the Bragg diffraction was first exploited by Jach et al (1988), who embedded a photodiode directly in the monochromator crystal to assist in tuning the crystals (Jach, 1990). Later, Erko et al (2001) and Krumrey and Ulm (2001) used the effect in an external photodiode to calibrate the energy scale of their X-ray monochromators.…”

Section: Introductionmentioning

confidence: 99%

“…Later, Erko et al (2001) and Krumrey and Ulm (2001) used the effect in an external photodiode to calibrate the energy scale of their X-ray monochromators. Hönnicke et al (2004) implemented it as a novel method to detect a diffracted beam at an angle of 90°. Hönnicke and Cusatis (2005) extended the idea of Jach et al (1988) by using a CCD as a monochromator crystal to simultaneously monochromatize the incoming X-rays and detect a spatially resolved image.…”

Section: Introductionmentioning

confidence: 99%

A diffraction effect in X-ray area detectors

Gollwitzer

Krumrey

2014

J Appl Cryst

View full text Add to dashboard Cite

When an X-ray area detector based on a single crystalline material, for instance, a state of the art hybrid pixel detector, is illuminated from a point source by monochromatic radiation, a pattern of lines appears which overlays the detected image. These lines can be easily found by scattering experiments with smooth patterns, such as small-angle X-ray scattering. The origin of this effect is the Bragg reflection in the sensor layer of the detector. Experimental images are presented over a photon energy range from 3.4 keV to 10 keV, together with a theoretical analysis. The intensity of this pattern is up to 20%, which can disturb the evaluation of scattering and diffraction experiments. The patterns can be exploited to check the alignment of the detector surface with the direct beam, and the alignment of individual detector modules with each other in the case of modular detectors, as well as for the energy calibration of the radiation.

show abstract

“…Self-detection of X-ray diffraction is achieved by measuring a decrease in the photocurrent or in the photocounting when a single-crystal detector is set in the diffraction condition (Zheludeva, 1985;Holý et al, 1985;Jach et al, 1988). This effect has been used for angular control of synchrotron monochromators (Jach, 1990;Hall et al, 2004), in determining the energy resolution of graded SiGe monochromators (Erko et al, 2001), and as a method for detecting X-ray diffraction at angles around and exactly equal to /2 (back-diffraction) (Hö nnicke et al, 2004). Also, self-detection imaging with the diffraction of a single-crystal CCD detector, at diffraction angles far from /2, has been reported (Hö nnicke & Mitschke et al, 2005).…”

Section: Introductionmentioning

confidence: 99%

Detection of the standing X-ray wavefield intensity inside a thin crystal using back-diffraction topography and imaging

Hönnicke¹,

Cusatis²

2009

J Appl Cryst

Self Cite

View full text Add to dashboard Cite

The standing X‐ray wavefield into a single‐crystal bulk is characterized by a combination of the diffracted–reflected h‐beams and the diffracted–transmitted o‐beam. For different angular positions on the total reflection region, the standing X‐ray wavefield has its maximum from the region between the atomic planes (low photoelectric absorption) to the region on the atomic planes (high photoelectric absorption). Historically, the evidence for such a characteristic has come from experiments such as anomalous transmission (Borrmann effect, originally detected in Laue geometry) and fluorescent measurements with a single crystal under diffraction conditions. In the present work, such a characteristic is demonstrated by the direct measurement of the standing X‐ray wavefield intensity into a 50 µm‐thick single‐crystal CCD detector (Si 800) set in back‐diffraction geometry.

show abstract

A new method to detect an X-ray diffracted beam at an angle of 90°

Cited by 7 publications

References 14 publications

Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer

Exotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer

A diffraction effect in X-ray area detectors

Detection of the standing X-ray wavefield intensity inside a thin crystal using back-diffraction topography and imaging

Contact Info

Product

Resources

About